2019
DOI: 10.1016/j.rinp.2019.102371
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Influence of deposition time in CdTe thin film properties grown by Close-Spaced Sublimation (CSS) for photovoltaic application

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Cited by 44 publications
(24 citation statements)
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“…The results are in line with previous studies [38,39]. Furthermore, numerous methods are available to calculate the diffraction profile, such as the Scherer formula or Williamson-Hall plot [6]. These methods defer in basis, which makes it difficult to compare them directly for a precise grain size estimation [6].…”
Section: Hall Effect Measurementsupporting
confidence: 88%
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“…The results are in line with previous studies [38,39]. Furthermore, numerous methods are available to calculate the diffraction profile, such as the Scherer formula or Williamson-Hall plot [6]. These methods defer in basis, which makes it difficult to compare them directly for a precise grain size estimation [6].…”
Section: Hall Effect Measurementsupporting
confidence: 88%
“…A single grain can comprise several domains with dissimilar orientations. Therefore, the grain size measured by SEM will be always larger or, in case of the perfect grains, equal to that calculated by XRD [6]. Consequently, a grain size measured using SEM is an average value, whereas the Scherrer formula calculates the crystallite size using the diffraction information from a single plane at a particular 2θ and FWHM value.…”
Section: Hall Effect Measurementmentioning
confidence: 96%
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