2009
DOI: 10.1088/0022-3727/43/1/015302
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Influence of chromium concentration on the optical–electronic properties of ruby microstructures

Abstract: Films of amorphous aluminium nitride (AlN) were prepared by conventional radio frequency sputtering of an Al + Cr target in a plasma of pure nitrogen. The Cr-to-Al relative area determines the Cr content, which remained in the ∼0–3.5 at% concentration range in this study. Film deposition was followed by thermal annealing of the samples up to 1050 °C in an atmosphere of oxygen and by spectroscopic characterization through energy dispersive x-ray spectrometry, photoluminescence and optical transmission measureme… Show more

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Cited by 8 publications
(2 citation statements)
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“…The same was observed by Cossolino and Zanatta in ruby microstructure doped with Cr [14]. Similar behavior exhibits second narrow band peaking at 721 nm (red shift of about 5 nm), which we associated with vibronic sidebands of the N line [15].…”
Section: Optical Propertiessupporting
confidence: 88%
“…The same was observed by Cossolino and Zanatta in ruby microstructure doped with Cr [14]. Similar behavior exhibits second narrow band peaking at 721 nm (red shift of about 5 nm), which we associated with vibronic sidebands of the N line [15].…”
Section: Optical Propertiessupporting
confidence: 88%
“…Various methods could be used for doped thin-film synthesis, such as RF sputtering, DC sputtering, magnetron sputtering, chemical vapor deposition, metal oxide chemical vapor deposition, molecular beam epitaxy, and ion implantation [6,7], but the most suitable method is the one where the target contamination is avoided and a conformal thin film could be obtained with cost-effective methods. The aforementioned techniques were already been reported by researchers for transition metal doping [8,9] where they studied the electronic and magnetic properties of transition metal-doped thin films instead of their structural and optical properties [10,11] which readily change by dopant material and the doping techniques. Moreover, the substrate effect of transition metal-doped prepared thin film was not observed previously.…”
Section: Introductionmentioning
confidence: 99%