2020
DOI: 10.1007/s12648-020-01840-1
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Influence of annealing processing on dissipation electrical energy, volume, and surface energy loss functions of CZO films

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Cited by 8 publications
(2 citation statements)
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“…e e e = + i 16 ) describing the phase difference between the induced current and the applied field [81,82]. Investigating the effect of gamma irradiation on d tan is critical.…”
Section: Dielectric Characterization Of the As-deposited And Ir Ppymentioning
confidence: 99%
“…e e e = + i 16 ) describing the phase difference between the induced current and the applied field [81,82]. Investigating the effect of gamma irradiation on d tan is critical.…”
Section: Dielectric Characterization Of the As-deposited And Ir Ppymentioning
confidence: 99%
“…25 This led to higher PCEs possibly due to shortening the optical bandgap and increasing electron transport capabilities of ZnO. [26][27][28] The atomic radius of Cu 2+ (0.73 A) is similar to that of Zn 2+ (0.74 A), thus making it easier for Cu 2+ to be incorporated into the crystal lattice by replacing Zn 2+ ions. 29 Cu 2+ may also form oxides on crystal surface which could inhibit the formation of Zn 2+ aggregates that appear due to interactions with acidic dyes.…”
Section: Introductionmentioning
confidence: 99%