Individual Cathodoluminescence and Photoluminescence Spectroscopy of Zinc Oxide Nanoparticles in Combination with <I>In Situ</I> Transmission Electron Microscopy

Abstract

The functions of scanning near-field optical microscopy (SNOM) were installed in high-resolution transmission electron microscopy (TEM) for cathodoluminescence spectroscopy and photoluminescence spectroscopy of individual nanostructures. Optical fiber probes used in SNOM were allowed to approach nanoparticles by piezomanipulation with simultaneous observation by TEM. As an application of this method, cathodoluminescence and photoluminescence from zinc oxide nanoparticles were measured at room temperature and 130 K. It was demonstrated that the present method directly provides the relationships between structural features of individual nanoparticles and spectra.

Optical and Optoelectronic Property Analysis of Nanomaterials inside Transmission Electron Microscope

“…The collection and introduction of light via the TEM column have been done using traditional optics (reflective surfaces, lenses, ellipsoidal and/or mirrors etc.) or optical fibers …”

“…Yoshida et al also employed an optical fiber via a port in the TEM column for in situ illumination . Further, a system of two optical fibers through ports in the TEM column have been used to measure photoluminescence from individual ZnO nanoparticles . The following paragraph describes the development of specialized TEM specimen holders to enable optical and optoelectronic studies inside TEM.…”

“…Therefore, scientists found it more advantageous to modify the TEM column or specimen holder to enable CL light collection. For instance, Kizuka et al measured CL emission from isolated ZnO nanoparticles (70–100 nm) inside TEM using an optical fiber . An interesting observation was that, even though all particles came from the same batch, some ZnO nanoparticles were luminescent, while some other particles were not.…”

“…EELS has a high spatial resolution, however, the energy resolution is typically of the order of 10 −1 eV, relatively low compared to photo‐induced absorption and emission spectroscopies that has an energy resolution better than 10 −3 eV . Light illumination inside TEM allows one to perform optical spectroscopies (Raman, PL and photocurrent) and important optoelectronic experiments, such as photocatalytic, photovoltaic and photocurrent measurements, hence, a direct correlation between functional optical properties and microstructure could be determined. Further, when light illumination is used in combination with TEM–STM operations for bending/stretching, one can measure piezophototronic properties of individual nanostructures in real time .…”

Development of an Apparatus forIn-situNear-Field Photoexcitation in a Transmission Electron Microscope

“…8) So far, near-field optical measurements with a light probe by using a small aperture, which is typically a tapered glass fiber covered with a thick metal layer, have been attempted in TEM. 12,13) However, such an aperture probe is unsuitable for TEM observation, since it is difficult to place the aperture in the immediate vicinity of a specimen with arbitrary morphology simultaneously with TEM observation.…”