2015
DOI: 10.1016/j.apsusc.2015.02.130
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Indium tin oxide with titanium doping for transparent conductive film application on CIGS solar cells

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Cited by 17 publications
(4 citation statements)
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“…These methods include substrate-heating during the thin-film deposition [9], and post-growth thermal annealing [10], which can effectively improve the crystallinity and optoelectronic properties of TCO thin films. During the fabrication of TCO films with high carrier mobility, transition-metal elements, such as Ti, Mo, W and Nb, are typically doped into indium oxide (In 2 O 3 ), improving their optoelectronic characteristics considerably [11,12,13,14]. …”
Section: Introductionmentioning
confidence: 99%
“…These methods include substrate-heating during the thin-film deposition [9], and post-growth thermal annealing [10], which can effectively improve the crystallinity and optoelectronic properties of TCO thin films. During the fabrication of TCO films with high carrier mobility, transition-metal elements, such as Ti, Mo, W and Nb, are typically doped into indium oxide (In 2 O 3 ), improving their optoelectronic characteristics considerably [11,12,13,14]. …”
Section: Introductionmentioning
confidence: 99%
“…As the ionic radiuses of Titanium (Ti 4+ ), tin (Sn 4+ ) and indium (In 3+ ) are 0.06, 0.07 and 0.09 nm, respectively [27], the small ionic radiuses of Sn 4+ and Ti 4+ imply that the crystalline structure may not change if these elements are used as dopant inIn 2 O 3 and/or ITO frameworks. As such, we postulate that enhancing the preferred orientation and enhancing the crystal growth of the 3-d metal-doped ITO thin films could be attributed to the introduction of Ti as a dopant [28,29]. Figures 2 and 3 also show that for both ITO and Tidoped ITO films the (222) and (400) peaks around 30.5°and 35.2°, respectively, featureprominently.…”
Section: Structural Propertiesmentioning
confidence: 80%
“…During annealing the adatoms gain additional energy resulting in an increased mobility. This enables grain growth and crystallization [32][33][34]. The grain sizes of as-deposited and annealed IAAI films were calculated using the Scherrer equation,…”
Section: Resultsmentioning
confidence: 99%