Index of refraction of n-type InP at 0.633- and 1.15-μm wavelengths as a function of carrier concentration

Abstract

Accurate values of the refractive index of n-type InP samples have been measured at two wavelengths, n = 0.633 μm and 1.15 μm, using a near-Brewster-angle reflectivity technique. For highly doped samples (carrier concentration ≳1018 cm−3) a relationship between carrier density and refractive index has been observed which can be explained in terms of conduction band filling.

Carrier-induced change due to doping in refractive index of InP: Measurements at 1.3 and 1.5 μm

“…A simple comparison of our results with those previously published, both experimental [5][6][7] or calculated, 8 show a general agreement. The overall tendency for a rapid decrease of n as soon as doping level exceeds 10 18 cm Ϫ3 can be clearly evidenced from Fig.…”

“…Evidently, such accuracy necessitates a thorough knowledge of free-carrier induced change in refractive index due for instance to voluntary impurity doping. Unfortunately, the few available experimental data [5][6][7] show marked discrepancies. One frequently resorted in a theoretical model 8 to evaluate doping influence.…”

New DFB grating structure using dopant-induced refractive index step

“…The three principal carrier-induced effects are due to the plasma effect, the Burstein-Moss effect and band gap shrinkage [8,9]. These effects have been calculated for a variety of materials by Bennett et al [10] and experimentally determined for InP [11,12]. In Fig.…”

Passivation de l'InP par oxydation en plasma RF oxygène et par action de HNO3 vapeur

“…OXYDES. -Les épaisseurs moyennes des oxydes ont été mesurées par ellipsométrie sous une incidence de 700 à 6 328 A en supposant un indice de l'InP N = 3,548 -0,28 i [4,5]. Les résultats des calculs d'épaisseur et d'indice à partir des paramètres ellipsométriques A, t/1 ont été obtenus avec une valeur nulle pour l'indice d'extinction kox de l'oxyde, les valeurs non nulles de kox conduisant à des épaisseurs incompatibles avec les mesures électriques.…”