Increasing Imaging Speed and Accuracy in Contact Mode AFM

Dzedzickis, Andrius; Bučinskas, Vytautas; Lenkutis, Tadas; Morkvėnaitė-Vilkončienė, Inga; Kovalevskyi, Viktor

doi:10.1007/978-3-030-13273-6_55

Cited by 3 publications

(3 citation statements)

References 16 publications

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“…Recently, in situ cantilever dynamic adjustment was proposed by applying aerodynamic force on the cantilever's upper surface [26,96,97]. This was proven to be effective for a contact mode.…”

Section: Adjustment and In Situ Control Of Cantilever Dynamic Charact...mentioning

confidence: 99%

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Dzedzickis,

Rožėnė,

Bučinskas

et al. 2023

Materials

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In this paper, we provide a systematic review of atomic force microscopy (AFM), a fast-developing technique that embraces scanners, controllers, and cantilevers. The main objectives of this review are to analyze the available technical solutions of AFM, including the limitations and problems. The main questions the review addresses are the problems of working in contact, noncontact, and tapping AFM modes. We do not include applications of AFM but rather the design of different parts and operation modes. Since the main part of AFM is the cantilever, we focused on its operation and design. Information from scientific articles published over the last 5 years is provided. Many articles in this period disclose minor amendments in the mechanical system but suggest innovative AFM control and imaging algorithms. Some of them are based on artificial intelligence. During operation, control of cantilever dynamic characteristics can be achieved by magnetic field, electrostatic, or aerodynamic forces.

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Section: Adjustment and In Situ Control Of Cantilever Dynamic Charact...mentioning

confidence: 99%

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Dzedzickis,

Rožėnė,

Bučinskas

et al. 2023

Materials

Self Cite

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“…Since the feedback loop is not used, the scanning speed of this method is fast, thus reducing the thermal drift effect. However, this method is not suitable for samples with large surface fluctuations [ 89 , 90 ].…”

Section: Afm Test On Asphalt Materialsmentioning

confidence: 99%

Application of Atomic Force Microscopy as Advanced Asphalt Testing Technology: A Comprehensive Review

et al. 2022

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In the past three decades, researchers have engaged in the relationship between the composition, macro performance, and microstructure of asphalt. There are many research results in the use of atomic force microscopy (AFM) to study the microstructure and related mechanisms of asphalt. Based on previous studies, the performance of asphalt from its microstructure has been observed and analyzed, and different evaluation indices and modification methods have been proposed, providing guidance toward improving the performance of asphalt materials and benefiting potential applications. This review focuses on the typical application and analysis of AFM in the study of the aging regeneration and modification properties of asphalt. Additionally, this review introduces the history of the rheological and chemical testing of asphalt materials and the history of using AFM to investigate asphalt. Furthermore, this review introduces the basic principles of various modes of application of AFM in the microstructure of asphalt, providing a research direction for the further popularization and application of AFM in asphalt or other materials in the future. This review aims to provide a reference and direction for researchers to further popularize the application of AFM in asphalt and standardize the testing methods of AFM. This paper is also helpful in further exploring the relationship between the microstructure and macro performance of asphalt.

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“…The tapping mode is preferred for experiments involving biological samples in liquids. The TM-AFM is the most widely used atomic force microscope [8][9][10].…”

Section: Introductionmentioning

confidence: 99%

The Impact of the Damping Coefficient on the Dynamic Stability of the TM-AFM Microcantilever Beam System

Song,

Li,

Cui

et al. 2024

Applied Sciences

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The tapping-mode atomic force microscope (TM-AFM) is widely used today; however, improper matching between the operating medium and the sampling time may lead to inaccurate measurement results. The relationship between the damping coefficient and the steady state of the TM-AFM microcantilever is investigated in this paper using multiple stability theory. Firstly, the effects of changes in dimensionless linear damping coefficients and dimensionless piezoelectric film damping coefficients on the motion stability of the system are examined using bifurcation diagrams, phase trajectories, and domains of attraction. Subsequently, the degrees of effect of the two damping coefficients on the stability of the system are compared. Finally, the bi-parametric bifurcation characteristics of the system under a specific number of iterative cycles are investigated using the bi-parametric bifurcation diagram in conjunction with the actual working conditions, and the boundary conditions for the transition of the system’s motion from an unstable state to a stable state are obtained. The results of the study show that to ensure the accuracy and reliability of the individual measurement data in 500 iteration cycles, the dimensionless linear damping coefficient must be greater than 0.01014. Our results will provide valuable references for TM-AFM measurement media selection, improving TM-AFM imaging quality, measurement accuracy and maneuverability, and TM-AFM troubleshooting.

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Increasing Imaging Speed and Accuracy in Contact Mode AFM

Cited by 3 publications

References 16 publications

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Application of Atomic Force Microscopy as Advanced Asphalt Testing Technology: A Comprehensive Review

The Impact of the Damping Coefficient on the Dynamic Stability of the TM-AFM Microcantilever Beam System

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