1998
DOI: 10.1103/physrevb.58.11215
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Inclusion of local structure effects in theoretical x-ray resonant scattering amplitudes using ab initio x-ray-absorption spectra calculations

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Cited by 119 publications

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“…At an incident x-ray energy of 778 eV (λ ≈ 16 Å) the 1/e attenuation length into UO 2 at an angle of incidence of ∼ 20 • is given by Henke et al [29] as 40 nm. However, these calculations do not take account of the strong white-line resonance at the N 4 absorption edge, common for soft x-ray energies [30], so the effective penetration is certainly far less than 20 nm, probably just a few nm, making this a surface sensitive experiment. This demand of a high-quality surface is a major disadvantage in the technique, and the role this plays in assessing the overall power of the technique is, as yet, challenging.…”
Section: Experimental Details and Results
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confidence: 99%