2009
DOI: 10.1016/j.infrared.2009.09.008
|View full text |Cite
|
Sign up to set email alerts
|

InAs/GaSb strained layer superlattice detectors with nBn design

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
2
0

Year Published

2011
2011
2023
2023

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 8 publications
(2 citation statements)
references
References 17 publications
0
2
0
Order By: Relevance
“…5.1. Indirect transitions in real space between holes in the barrier (InGaSbN) and electrons in the well (InAs) layers were the main mechanism for the absorption of light [17]. In Optel, instead of using the superlattice wavevector in the z direction, q z (also known as k z or the momentum of an electron/hole in the growth direction), a normalized wavevector was defined as Q z = q z t p /.…”
Section: Discussionmentioning
confidence: 99%
“…5.1. Indirect transitions in real space between holes in the barrier (InGaSbN) and electrons in the well (InAs) layers were the main mechanism for the absorption of light [17]. In Optel, instead of using the superlattice wavevector in the z direction, q z (also known as k z or the momentum of an electron/hole in the growth direction), a normalized wavevector was defined as Q z = q z t p /.…”
Section: Discussionmentioning
confidence: 99%
“…Sample A has a typical dark current characteristics of minority carrier unipolar devices with a fast increase current in the entire bias range. 6,7,11 In contrast, sample B appears to have the back-to-back diode behavior with the I-V on the negative bias side corresponding to the reverse bias behavior of the "active-region-diode" and the I-V on the positive bias side corresponding to the reverse bias behavior of the lower doped "p-contact-diode. "…”
mentioning
confidence: 97%