In situ x-ray diffraction study of crystallization kinetics in PbZr1-xTixO3, (PZT, x = 0.0, 0.55, 1.0)

Wilkinson, Angus P.; Speck, James S.; Cheetham, Anthony K.; Natarajan, Srinivasan; Thomas, John Meurig

doi:10.1021/cm00042a009

Cited by 134 publications

(97 citation statements)

References 2 publications

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“…This undesirable non-ferroelectric phase is often described as a pyrochlore, sometimes also referred as Pbdeficient fluorite phase. 10 The presence of this phase degrades the most important ferroelectric properties of the film and consequently must be avoided during the crystallization. Although different studies were conducted on PZT films produced by polymer precursor method, 11 up to now the kinetics of growth of the perovskite phase in these films is not yet systematically studied, as well the thickness effect on the structure, dielectric, and piezoelectric properties of these films.…”

Section: Introductionmentioning

confidence: 99%

Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

Araújo

Lima

Bdikin

et al. 2013

Journal of Applied Physics

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Lead zirconate titanate Pb(Zr 0.50 Ti 0.50 )O 3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO 2 /Si substrates to understand the mechanisms of phase transformations and the effect of film thickness on the structure, dielectric, and piezoelectric properties in these films. PZT films pyrolyzed at temperatures higher than 350 C present a coexistence of pyrochlore and perovskite phases, while only perovskite phase grows in films pyrolyzed at temperatures lower than 300 C. For pyrochlore-free PZT thin films, a small (100)-orientation tendency near the film-substrate interface was observed. Finally, we demonstrate the existence of a self-polarization effect in the studied PZT thin films. The increase of self-polarization with the film thickness increasing from 200 nm to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-substrate interface are not primarily responsible for the observed self-polarization effect in our films. V C 2013 AIP Publishing LLC [http://dx

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Section: Introductionmentioning

confidence: 99%

Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

Araújo

Lima

Bdikin

et al. 2013

Journal of Applied Physics

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show abstract

“…The defining difference between the two phases is the presence (pyrochlore) or absence (fluorite) of ionic ordering. [17,18] Such ordering can occur along with Pb loss during crystallization/annealing, but in terms of the effects on properties, it is unimportant whether the Pb-deficient phase is classified as fluorite or pyrochlore. In-depth analysis of ionic ordering is outside the scope of this Communication, so we will use the term ''fluorite'' to refer to the non-ferroelectric crystalline PZT-based phase(s).…”

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confidence: 99%

Reversibility of the Perovskite‐to‐Fluorite Phase Transformation in Lead‐Based Thin and Ultrathin Films

et al. 2008

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Lead-based perovskite materials currently form the basis of an approximately $5 billion/year market because of their outstanding ferroelectric and electromechanical properties. The volatility of the Pb cation at the elevated temperatures required for material fabrication and phase development has always created difficulties, because even slight deviations from the proper stoichiometry lead to the formation of a non-ferroelectric (and property-destroying) fluorite phase. As researchers strive to integrate these materials into nanometer-scale devices, they are finding that the traditional methods of Pb stoichiometry control are no longer effective owing to increased surface/volume ratio and enhanced interactions with commonly used Pt electrodes.[1] We demonstrate a novel approach for the fabrication of lead zirconate titanate (PZT)-based thin and ultrathin films that exploits the previously unreported reversibility of a phase transformation between the stoichiometric ferroelectric perovskite and the Pb-deficient non-ferroelectric fluorite to produce single-phase materials with excellent electrical properties while minimizing chemical heterogeneities within the film and interactions with the electrode. Recent work has demonstrated that ferroelectric behavior may persist at length scales below 10 nm, [2][3][4][5] and under certain conditions, perhaps all the way to the unit cell level. [6,7] While these studies suggest the possibility of integrated ferroelectricbased nanodevices, they have so far dealt with model systems using lattice-matched substrates and electrodes onto which epitaxial films were deposited. Because of their high remanent polarization and outstanding electromechanical properties, complex Pb-based materials such as PZT are well-suited for applications including ferroelectric non-volatile memory (FERAM), actuators for micro-/nanoelectromechanical systems (MEMS/NEMS), and piezoelectric energy harvesting.

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“…The first challenge in structural development is to form the desired perovskite crystal structure and eliminate the metastable pyrochlore (or fluorite [38]) form. On heating, pyrochlore forms at a lower temperature than does perovskite [39][40][41] and is a common alternative form for many perovskite ferroelectrics, particularly relaxor ferroelectrics.…”

Section: Thin-film Processing Structural Evolution and Propertiesmentioning

confidence: 99%

Piezoelectric Pressure Sensor Based on Enhanced Thin-Film PZT Diaphragm Containing Nanocrystalline Powders

Mohammadi¹,

Mohammadi²,

Barghi³

2013

Piezoelectric Materials and Devices - Practice and Applications

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In situ x-ray diffraction study of crystallization kinetics in PbZr1-xTixO3, (PZT, x = 0.0, 0.55, 1.0)

Cited by 134 publications

References 2 publications

Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

Reversibility of the Perovskite‐to‐Fluorite Phase Transformation in Lead‐Based Thin and Ultrathin Films

Piezoelectric Pressure Sensor Based on Enhanced Thin-Film PZT Diaphragm Containing Nanocrystalline Powders

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