2021
DOI: 10.1002/smll.202007053
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In Situ Resistive Switching Effect Scrutinization on Co‐Designed Graphene Sensor

Abstract: Resistive switching (RS), an electric property based on the forming and rupture of conductive filaments in metal‐insulator‐metal structures, has attracted intensive attention due to its potential application in next generation energy‐efficient and area‐efficient memory devices. In situ studies of the RS effect are urgently needed for its mechanism understanding and memristive performance improvement. Here investigations of both the RS effect as well as the gate tunable conductance quantization effect are reali… Show more

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Cited by 5 publications
(6 citation statements)
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“…In this case, the accumulated channels would significantly reduce the resistivity of memristor, but thermal effect will also get stronger, leading to reversible breakdown. [53] To reveal the conduction process of LDH/graphene device, overall analysis of I-V characteristics from electroforming process was conducted (Figure 3d). Fresh device usually maintained initially resistive state, which means the ion dynamic was endogenously ordered and keep at charge-balancing environment as illustrated in Figure 3g.…”
Section: Introductionmentioning
confidence: 99%
“…In this case, the accumulated channels would significantly reduce the resistivity of memristor, but thermal effect will also get stronger, leading to reversible breakdown. [53] To reveal the conduction process of LDH/graphene device, overall analysis of I-V characteristics from electroforming process was conducted (Figure 3d). Fresh device usually maintained initially resistive state, which means the ion dynamic was endogenously ordered and keep at charge-balancing environment as illustrated in Figure 3g.…”
Section: Introductionmentioning
confidence: 99%
“…Basically, the evolution of V T can be translated into the downshift of Fermi level, meanwhile confirming its good accordance to increasing work function in KPFM analysis. [6,26] In this case, the electron concentration can express as:…”
Section: Resultsmentioning
confidence: 99%
“…Basically, the evolution of V T can be translated into the downshift of Fermi level, meanwhile confirming its good accordance to increasing work function in KPFM analysis. [ 6,26 ] In this case, the electron concentration can express as: nbadbreak=C0(VGSbadbreak−VT)normal/e\[ \begin{array}{*{20}{c}}{n = {C_0}\left( {{V_{{\rm{GS}}}} - {V_{\rm{T}}}} \right){\rm{/}}e}\end{array} \] where C 0 is the capacitance of SiO 2 . Therefore, it can be extracted that the incorporation of oxygen species will cause the reduction of electron concentration by 0.11 × 10 12 , 0.17 × 10 12 , and 0.43 × 10 12 cm −2 in terms of treatment procedure.…”
Section: Resultsmentioning
confidence: 99%
“…The low-frequency noise decreases the detection reliability of 2D FET sensors in operation. (iii) The miniaturization might meet a limitation from the overload current issue. , Along with increasing transistor density, the accumulated current heat would ruin the 2D semiconductor due to confined thermal dissipation. ,, (iv) The integration density of 2D FET sensors is limited due to their local defects and grain boundaries generated in the synthesis process (e.g., CVD and LPE). , …”
Section: Prototypical Designmentioning
confidence: 99%