2021
DOI: 10.20944/preprints202105.0121.v1
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In-Process Measurement of Three-Dimensional Deformations Based on Speckle Photography

Abstract: In the concept of the process signature, the relationship between a material load and the modification remaining in the workpiece is used to better understand and optimize manufacturing processes. The basic prerequisite for this is to be able to measure the loads occurring during the machining process in the form of mechanical deformations. Speckle photography is suitable for this in-process measurement task and is already used in a variety of ways for in-plane deformation measurements. The shortcoming of this… Show more

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Cited by 3 publications
(2 citation statements)
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“…From the simulation, we estimate a maximum systematic error of around 60 nm with 𝑊 ev = 10 Pixel. The maximum cumulative uncertainty of the measurement reported in [6] is 22 nm. Thus, systematic errors due to displacement gradients are a significant and previously not considered contribution to the measurement uncertainty budget, which deserve further attention.…”
Section: Resultsmentioning
confidence: 97%
See 1 more Smart Citation
“…From the simulation, we estimate a maximum systematic error of around 60 nm with 𝑊 ev = 10 Pixel. The maximum cumulative uncertainty of the measurement reported in [6] is 22 nm. Thus, systematic errors due to displacement gradients are a significant and previously not considered contribution to the measurement uncertainty budget, which deserve further attention.…”
Section: Resultsmentioning
confidence: 97%
“…Decreasing the DIC evaluation window size 𝑊 ev reduces the systematic error, but in turn increases the random error. In order to demonstrate the relevance of the systematic errors studied here, an in-process measurement during a single tooth milling process from [6] is considered. Fig.…”
Section: Resultsmentioning
confidence: 99%