1998
DOI: 10.1063/1.121774
|View full text |Cite
|
Sign up to set email alerts
|

In-plane gates and nanostructures fabricated by direct oxidation of semiconductor heterostructures with an atomic force microscope

Abstract: The surface of shallow Ga[Al]As heterostructures is locally oxidized with an atomic force microscope. The electron gas underneath the oxide is depleted. We demonstrate experimentally that these depleted regions of the two-dimensional electron gas can be made highly resistive at liquid nitrogen temperatures. Thus, local anodic oxidation of high electron mobility transistors with an atomic force microscope provides a novel method to define nanostructures and in-plane gates. Two examples, namely antidots and quan… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

1
99
0

Year Published

1999
1999
2013
2013

Publication Types

Select...
7
2
1

Relationship

2
8

Authors

Journals

citations
Cited by 159 publications
(100 citation statements)
references
References 22 publications
1
99
0
Order By: Relevance
“…[7][8][9][10][11][12][13][14] Recently this field has experienced a renovated interest. For one side, several results have contributed to an increased understanding of the oxidation mechanism in silicon surfaces 15,16 and its kinetics.…”
Section: Introductionmentioning
confidence: 99%
“…[7][8][9][10][11][12][13][14] Recently this field has experienced a renovated interest. For one side, several results have contributed to an increased understanding of the oxidation mechanism in silicon surfaces 15,16 and its kinetics.…”
Section: Introductionmentioning
confidence: 99%
“…9 We found that the unpassivated surface is rapidly etched away at the required biases due to local anodic oxidation ͑LAO͒. 10 Apart from giving rise to a highly unstable tunneling current, the LAO process also etches away the active layers within minutes when the scan mode is disabled. It is worthwhile to point out that we succeeded in observing an STL signal without passivating the surface by removing the native oxide with ammonia and immediately placing the sample in the STL setup.…”
mentioning
confidence: 99%
“…1 Recently, a new technology has been developed: the atomic force microscope ͑AFM͒ mediated direct oxidation of semiconductor surfaces. 2 By this method, the surface of shallow Ga͓Al͔As heterostructures has been patterned; in particular, antidot lattices have been produced with periods down to 250 nm. Direct local anodic oxidation of high-mobility transistors has been shown to provide an effective in situ control of patterning semiconductor nanostructures.…”
mentioning
confidence: 99%