Patterning of silicon surfaces with noncontact atomic force microscopy: Field-induced formation of nanometer-size water bridges

García, Ricardo García; Calleja, Montserrat; Rohrer, H.

doi:10.1063/1.370985

Cited by 199 publications

(164 citation statements)

References 34 publications

(24 reference statements)

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“…In this simple approximation the field E 0 = E(z=0,r=0) is the key parameter to obtain V th . Assuming that E 0 is constant over the whole liquid volume, the electrostatic energy is: , and compared with published data from Garcia et al 20 As can be seen the agreement with the experimental data is very good. Although the assumption of a flat film is sufficient to predict a reasonable value for V th , it cannot explain the effects that result from the real shape of the water meniscus before the bridge is formed.…”

Section: Theoretical Modelmentioning

confidence: 52%

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Induced Water Condensation and Bridge Formation by Electric Fields in Atomic Force Microscopy

2006

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Section: Theoretical Modelmentioning

confidence: 52%

“…For that reason we use the Radial Field Approximation (RFA), which assume that the electric field is the same as that inside a spherical capacitor, with the spherical tip being the central electrode 20 .…”

Section: Theoretical Modelmentioning

confidence: 99%

Induced Water Condensation and Bridge Formation by Electric Fields in Atomic Force Microscopy

2006

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“…Water condenses into the gap at the contact region between hydrophilic particles. This is with AFM [69,119,[190][191][192][193][194][195][196][197][198]. Many experiments showed a significant dependency of the adhesion force on the relative humidity [40,52,54,56,57,183].…”

Section: Influence Of Humidity On Adhesionmentioning

confidence: 90%

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

et al. 2006

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To optimize the handling of fine powders in industrial applications, understanding the interaction forces between single powder particles is fundamental. The forces between colloidal particles dominate the behavior of a great variety of materials, including paints, paper, soil, and many industrial processes. With the invention of the atomic force microscope (AFM), the direct measurement of the interaction between single micron-sized particles became possible. The adhesional contact between a particle and a substrate is a parameter for analyzing pull-off force data generated by AFM. The aim of this study was to understand surface interactions between fine particles. I measured the adhesion forces between AFM tips or particles attached to AFM cantilevers and different solid samples. Smooth and homogeneous surfaces such as silicon wafer, mica, or highly oriented pyrolytic graphite (HOPG), and more rough and heterogeneous surfaces such as iron particles or patterns of TiO 2 nanoparticles on silicon wafer were used. First, I addressed to the wellknown issue that AFM adhesion experiment results show wide distributions of adhesion forces rather than a single value. My experimental results show that variations in adhesion forces comprise fast (i.e., from one force curves to the next) random fluctuations and slower fluctuations, which occur over tens or hundreds of consecutive measurements. Slow fluctuations are not likely to be the result of variations in external factors such as lateral position, temperature, humidity, and so forth because those were kept constant. Even if two solid bodies are brought into contact under precisely the same conditions (same place, load, direction, etc.) the result of such a measurement will often not be the same as for the previous contact. The measurement itself will induce structural changes in the contact region which can change the value for the next adhesion force measurement.In the second part I studied the influence of humidity on the adhesion of nanocontacts. Humidity was adjusted relatively fast to minimize tip wear during one experiment. For hydrophobic surfaces, no signification change of adhesion force with humidity was observed. Adhesion force-versus-humidity curves recorded with hydrophilic surfaces either showed a maximum or continuously increased. I demonstrate that the results can be interpreted with simple continuum theory of the meniscus force. The meniscus force is calculated based on a model that includes surface roughness and takes into account different AFM tip (or particle) shapes by a two-sphere-model.Experimental and theoretical results show that the precise contact geometry has a critical influence on the humidity dependence of the adhesion force.Changes of tip geometry on the sub-10-nm length scale can completely change adhesion force-versus-humidity curves. Our model can also explain the differences between earlier AFM studies, where different dependencies of the adhesion force on humidity were observed.Keywords: Atomic force microscopy (AFM), cantile...

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“…The region is usually defined by either a combination of the probe-sample surface geometry or the combination of the geometry and another factor that could be an external electrical field or a liquid meniscus. In particular nanometer-size water meniscus 11 have appeared as remarkable tools to either confine the lateral extension of a chemical reaction or to control the lateral diffusion of organic molecules. Given the meniscus nanoscale size, nanofabrication and nanochemistry are intimately linked in the SPL methods reviewed here.…”

Section: Ricardo García (1960) Is a Professor Of Scientific Research mentioning

confidence: 99%

Nano-chemistry and scanning probe nanolithographies

García¹,

Martínez²,

Martínez³

2006

Chem. Soc. Rev.

355

306

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The development of nanometer-scale lithographies is the focus of an intense research activity because progress on nanotechnology depends on the capability to fabricate, position and interconnect nanometer-scale structures. The unique imaging and manipulation properties of atomic force microscopes have prompted the emergence of several scanning probe-based nanolithographies. In this tutorial review we present the most promising probe-based nanolithographies that are based on the spatial confinement of a chemical reaction within a nanometer-size region of the sample surface. The potential of local chemical nanolithography in nanometer-scale science and technology is illustrated by describing a range of applications such as the fabrication of conjugated molecular wires, optical microlenses, complex quantum devices or tailored chemical surfaces for controlling biorecognition processes.

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Patterning of silicon surfaces with noncontact atomic force microscopy: Field-induced formation of nanometer-size water bridges

Cited by 199 publications

References 34 publications

Induced Water Condensation and Bridge Formation by Electric Fields in Atomic Force Microscopy

Induced Water Condensation and Bridge Formation by Electric Fields in Atomic Force Microscopy

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

Nano-chemistry and scanning probe nanolithographies

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