In-Place FPGA Retiming for Mitigation of Variational Single-Event Transient Faults

Xu, Wenyao; Wang, Jia; Hu, Yu; Lee, Ju-Yueh; Gong, Fengkui; He, Lei; Sarrafzadeh, Majid

doi:10.1109/tcsi.2010.2094370

Cited by 10 publications

(4 citation statements)

References 32 publications

(17 reference statements)

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“…The pulse broadening combined with the higher work frequencies and the higher technology scaling of SRAM-based FPGAs make SEUs induced by SETs sampling a common source of errors for them, more than in Flash-based FPGAs [13]. In order to assert how much a memory element can be affected by soft errors caused by SETs, the value of the PIPB introduced by the combinational logic located between the node where the pulse is generated, and the input of the memory element is fundamental [14].…”

Section: Background and Related Work A Propagation Induced Pulse Broadening And Errorsmentioning

confidence: 99%

Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect

et al. 2019

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SRAM-based field programmable gate arrays (FPGAs) are widely used in mission-critical applications, such as aerospace and avionics. Due to the increasing working frequency and technology scaling of ultra-nanometer technology, single event transients (SETs) are becoming a major source of errors for these devices. In this paper, we propose a workflow for evaluating the behavior of SETs in SRAMbased FPGAs. The method is able to compute the propagation-induced pulse broadening (PIPB) effect introduced by the logic resources traversed by transient pulses. Besides, we developed an accurate lookup table (LUT) layout model able to effectively predict the kinds of the SETs induced by radiation-particle and to accurately mimic the phenomena of the SET generation and propagation. The proposed methodology is applicable to any recent technology to provide the SET analysis, necessary for an efficient mitigation technology. The experimental results achieved from a set of benchmark circuits mapped on a 28-nm SRAM-based FPGA and compared with the fault injection experiments demonstrate the effectiveness of our technique. INDEX TERMSFunction generator, propagation induced pulse broadening, LUTs, single event transients, SRAM-based FPGA.

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Section: Background and Related Work A Propagation Induced Pulse Broadening And Errorsmentioning

confidence: 99%

Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect

et al. 2019

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“…A preliminary place and route algorithm developed for this specific purpose has been proposed in [68], while a placement re-timing algorithm has been proposed in [82]. However, an accurate radiation experiment evaluation of this approach [69] showed that it is only capable to partially reduce the overall SET sensitivity of a circuit, while most of the transient errors are bypassing the filtering optimizations.…”

Section: Previous Analysis and Mitigation Techniques For Sees Onmentioning

confidence: 99%

Fault tolerant electronic system design

Sterpone

2017

2017 IEEE International Test Conference (ITC)

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“…Single event transients (SETs), voltage disturbances generated when particles strike sensitive nodes [1], may propagate through the logic and eventually be latched, leading to behavioural errors of affected circuits [2]. As technology shrinks and operating frequencies increase, SETs are an ever-increasing issue for integrated circuits (ICs) adopted in safety-critical applications [3,4,5,6].…”

Section: Introductionmentioning

confidence: 99%