2013
DOI: 10.1016/j.solmat.2013.01.007
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In-line spectroscopic ellipsometry for the monitoring of the optical properties and quality of roll-to-roll printed nanolayers for organic photovoltaics

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Cited by 28 publications
(25 citation statements)
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“…A system has been developed with single point monitoring, which can scan the sample surface with movement stages [102,103]. This has been used to monitor roll-to-roll printed organic solar cell layers on a lab-scale system.…”
Section: Thickness Monitoringmentioning
confidence: 99%
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“…A system has been developed with single point monitoring, which can scan the sample surface with movement stages [102,103]. This has been used to monitor roll-to-roll printed organic solar cell layers on a lab-scale system.…”
Section: Thickness Monitoringmentioning
confidence: 99%
“…This system has been used to characterize barrier films of homogeneous metal layers on PET and tested at an industrial site [104], using the methodology of Logothetidis mentioned above [102]. Recent work in the Clean4Yield project has led to improved acquisition times of 1–10 ms and the addition of an index-matching roller to reduce the strength of back-reflections from the underside of the substrate [87].…”
Section: Thickness Monitoringmentioning
confidence: 99%
“…Clearly, the use of in‐situ ellipsometry for the characterization of conjugated polymer films upon annealing or during deposition is still at an early stage of development, but very promising results have already been reported, encouraging further investigations. In particular, it could represent a very powerful technique to understand the molecular kinetics during film formation and post‐deposition treatments, as well as for the in‐situ characterization of layers and stacks during roll‐to‐roll processing …”
Section: In‐situ Ellipsometry For Monitoring Film Deposition and Strumentioning
confidence: 99%
“…The technique can be applied in‐situ and in real‐time, allowing both the determination of thin film phase transition temperatures and studies of drying kinetics during film deposition and temporal changes in morphology during post‐deposition treatments (thermal and solvent annealing, etc.) Recently, ellipsometry has even been proposed for in‐line monitoring of organic photovoltaic (OPV) thin film microstructure during roll‐to‐roll processing …”
Section: Introductionmentioning
confidence: 99%
“…The system was used to study the interaction of the over‐coating of several functional layers in organic tandem solar cells, and 3D X‐ray phase contrast imaging (ptychography) gave further insight into a complete 12‐layer solar cell stack 127. Another method that has been explored for in‐line measurements of film thicknesses and optical properties of OPV‐specific layers is spectroscopic ellipsometry 128. The high‐speed measurement system has been integrated into an experimental R2R gravure printing machine to study printed transparent electrodes, active layer inks, and barrier layers under different processing conditions such as corona treatment or drying temperature.…”
Section: Solution‐processed Pv: From Lab To Fabmentioning
confidence: 99%