2011
DOI: 10.1016/j.tsf.2011.02.034
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In diffusion and electronic energy structure in polymer layers on In tin oxide

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Cited by 20 publications
(9 citation statements)
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“…However, several reports suggest that the acidic nature of PEDOT:PSS can negatively affect interfacial stability because it can react with ITO to cause the diffusion of In ions into both PEDOT:PSS and the active layer, which will degrade both materials. 92,93 In addition, the diffusion of silver into PEDOT:PSS to form electrical shorting paths was also reported for the inverted cells (Fig. 5a and b).…”
Section: Improving Interfacial Stability Between the Active Layer And...supporting
confidence: 52%
“…However, several reports suggest that the acidic nature of PEDOT:PSS can negatively affect interfacial stability because it can react with ITO to cause the diffusion of In ions into both PEDOT:PSS and the active layer, which will degrade both materials. 92,93 In addition, the diffusion of silver into PEDOT:PSS to form electrical shorting paths was also reported for the inverted cells (Fig. 5a and b).…”
Section: Improving Interfacial Stability Between the Active Layer And...supporting
confidence: 52%
“…The In diffuses easily from ITO into the PEDOT:PSS to an atomic concentration of 1.3% 6 0.1% but abruptly decreases at the active polymer layer boundary to 0.03% 6 0.01%, in agreement with previous reports. 16,17 The peaks from the 6-month-old In-OPV device are closest in position and shape to that of the native In oxide on the un-etched In foil. In comparison, the peaks of the 24-hour-old In device are much narrower.…”
mentioning
confidence: 98%
“…[ 103,104 ] This instability arises as both indium and tin ions migrate into the acidic PEDOT:PSS layer, inducing new electronic states and resulting in diminished performance. [ 104,105 ] Similarly, back electrode diffusion has also been observed as commonly used Ag, Al, and Ca have been found to diffuse into the neighboring charge transport layer and also further into the active layer. [ 106–108 ] These diffusion pathways are illustrated in Figure 5 , indicating both a conventional and inverted OPV arrangement.…”
Section: Degradation Principlesmentioning
confidence: 99%