2001
DOI: 10.1016/s0040-6090(00)01717-x
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Impurity doping and compensation mechanisms in CdTe

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Cited by 79 publications
(40 citation statements)
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“…During CdCl 2 treatment, a liquid layer is formed at the grain boundaries, and Cl is readily mobile along the grain boundaries. However the diffusion of Cl is slow into the crystalline materials in the grain [45]. Therefore, the Cl-diffused layer is simply a thin skin for each CdTe grain existing between the CdS and the back electrical contact.…”
Section: Effects Of Nano-and Micro-rods On Devicesmentioning
confidence: 99%
“…During CdCl 2 treatment, a liquid layer is formed at the grain boundaries, and Cl is readily mobile along the grain boundaries. However the diffusion of Cl is slow into the crystalline materials in the grain [45]. Therefore, the Cl-diffused layer is simply a thin skin for each CdTe grain existing between the CdS and the back electrical contact.…”
Section: Effects Of Nano-and Micro-rods On Devicesmentioning
confidence: 99%
“…This was attributed to the preferential removal of cadmium by the gold chloride solution and subsequent precipitation of cadmium chloride due to supersaturation of the Cd 2+ and Cl − containing solution. The precipitation of CdCl 2 will reduce the crystal quality and increase voiding [33][34][35][36] due to the solubility of chloride salts and sub-surface stress from lattice mismatches causing strain and local deformations. The bright regions observed in the bright field image of figure 4 were consistent with porosity or voiding.…”
Section: Fib and Tem Analysismentioning
confidence: 99%
“…The cadmium peak is known to shift to higher binding energies when bound with Cl [20,43]. The ratio of the second cadmium PCA component (Cd PCA2) to chlorine (Cl 2p) was found to be ∼1 : 1 throughout the profile suggesting a phase of CdCl, although CdCl 2 could have formed [33][34][35][36] with the ratio distorted by preferential etching. The position (405.0 eV) and distribution of the first cadmium component (Cd PCA1) was consistent with cadmium bound as CdZnTe.…”
Section: Xps Depth Profilesmentioning
confidence: 99%
“…The precipitation of CdCl 2 within the interface occurs during electroless deposition as the concentration of Cd 2+ and Cl − reach supersaturation levels within the solution. Chloride species have previously been observed in the interface following electroless deposition [50][51][52][53] and PCA analysis of XPS measurements [41] have confirmed that the depth distribution of metal chloride correlates with that of a compound of cadmium other than CdZnTe.…”
Section: Role Of Subsurface Voidsmentioning
confidence: 75%
“…The current FIB images show subsurface voids in the CdZnTe crystal below the contact. The presence of voids and degradation of crystal quality has been attributed to the precipitation of CdCl 2 [50][51][52][53]. Voids and local deformations form due to stress from lattice mismatches and the solubility of chloride salts.…”
Section: Role Of Subsurface Voidsmentioning
confidence: 99%