The short hole diffusion length (HDL) and high interfacial
recombination
are among the main drawbacks of semiconductor-based solar energy systems.
Surface passivation and introducing an interfacial layer are recognized
for enhancing HDL and charge carrier separation. Herein, we introduced
a facile recipe to design a pinholes-free BiVO4 photoanode
with a NiV2O6 back contact interfacial (BCI)
layer, marking a significant advancement in the HDL and photoelectrochemical
activity. The fabricated BiVO4 photoanode with NiV2O6 BCI layer exhibits a 2-fold increase in the
HDL compared to pristine BiVO4. Despite this improvement,
we found that the front surface recombination still hinders the water
oxidation process, as revealed by photoelectrochemical (PEC) studies
employing Na2SO3 electron donors and by intensity-modulated
photocurrent spectroscopy measurements. To address this limitation,
the surface of the NiV2O6/BiVO4 photoanode
was passivated with a cobalt phosphate electrocatalyst, resulting
in a dramatic enhancement in the PEC performance. The optimized photoanode
achieved a stable photocurrent density of 4.8 mA cm–2 at 1.23 VRHE, which is 12-fold higher than that of the
pristine BiVO4 photoanode. Density Functional Theory (DFT)
simulations revealed an abrupt electrostatic potential transition
at the NiV2O6/BiVO4 interface with
BiVO4 being more negative than NiV2O6. A strong built-in electric field is thus generated at the interface
and drifts photogenerated electrons toward the NiV2O6 BCI layer and photogenerated holes toward the BiVO4 top layer. As a result, the back-surface recombination is minimized,
and ultimately, the HDL is extended in agreement with the experimental
findings.