Improving lateral resolution of electrostatic force microscopy by multifrequency method under ambient conditions

Ding, Xiaoyun; An, Joonho; Xu, Jianbin; Li, C.; Zeng, Ran

doi:10.1063/1.3147198

Cited by 24 publications

(24 citation statements)

References 25 publications

(27 reference statements)

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“…Second, ω 2 is more sensitive to changes in force gradient than ω 1 because the minimal detectable force gradient is inversely proportional to the frequency and the Q-factor of the resonance peak, which is higher at ω 2 (Q(ω 2 ) ~500) than at ω 1 (Q(ω 1 ) ~170) (Hoummady and Farnault, 1998). Third, the contribution of the electrostatic interaction between the cantilever and the sample to the electrostatic force is minimized at ω 2 , thereby enhancing spatial resolution in the DREEM image (Ding et al, 2009). Fourth, higher eigenmodes provide enhanced phase contrast compared to the fundamental mode of tip oscillation for both AFM and EFM imaging (Martínez et al, 2008; Stark et al, 1999; Thompson et al, 2013).…”

Section: Designmentioning

confidence: 99%

Visualizing the Path of DNA through Proteins Using DREEM Imaging

Kaur

et al. 2016

Molecular Cell

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SUMMARY Many cellular functions require the assembly of multiprotein-DNA complexes. A growing area of structural biology aims to characterize these dynamic structures by combining atomic-resolution crystal structures with lower-resolution data from techniques that provide distributions of species, such as small-angle X-ray scattering, electron microscopy, and atomic force microscopy (AFM). A significant limitation in these combinatorial methods is localization of the DNA within the multiprotein complex. Here, we combine AFM with an electrostatic force microscopy (EFM) method to develop an exquisitely sensitive dual-resonance-frequency-enhanced EFM (DREEM) capable of resolving DNA within protein-DNA complexes. Imaging of nucleosomes and DNA mismatch repair complexes demonstrates that DREEM can reveal both the path of the DNA wrapping around histones and the path of DNA as it passes through both single proteins and multiprotein complexes. Finally, DREEM imaging requires only minor modifications of many existing commercial AFMs, making the technique readily available.

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Section: Designmentioning

confidence: 99%

Visualizing the Path of DNA through Proteins Using DREEM Imaging

Kaur

et al. 2016

Molecular Cell

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“…The above results suggest that a higher measurement frequency leads to a decreased cantilever-sample effect, resulting in better lateral resolution for potential measurements in KPFM. In previous studies, cantileversample interactions in lift-mode AM-KPFM were decreased by using the second resonance frequency in the potential measurements, leading to better lateral resolution [15,16]. The probe-sample interactions were estimated from a simple cantilever-sample and tip-sample capacitance model.…”

Section: Resultsmentioning

confidence: 99%

“…The signs of the capacitance gradients C ′ 2−1 and C ′ 2−2 are opposite, therefore, C ′ cantilever (ω 2 ) is smaller than C ′ cantilever (ω 1 ). Ding et al reported the ca- pacitance models for the first and second eigenmodes, and described that the second eigenmode led to a decreased cantilever-sample capacitive effect and an increased tipsample effect [16]. Similarly, opposition between C ′…”

Section: Resultsmentioning

confidence: 99%

Applying Second and Third Resonance Frequencies to Surface Potential Measurements with Kelvin Probe Force Microscopy

Honda

Itoh

2018

e-J. Surf. Sci. Nanotech.

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Frequency separation between topography and potential scans in Kelvin probe force microscopy (KPFM) was investigated. Topographic images were scanned via the first resonance frequency of the cantilever excited mechanically. Potential images were scanned via the first, second, or third resonance frequency of the cantilever excited electrostatically. Good separation of the mechanical modulation to the cantilever in AC mode and the potential modulation to the probe tip was obtained when the second or third modulation frequency was used. Higher resonance modes led to a decreased capacitive effect between the cantilever and sample, which resulted in better lateral resolution of potential measurements, mainly owing to the tip-sample capacitive effect. The shorter time scale of amplitude change in the cantilever oscillation for the higher resonance frequencies led to wellconverged potential measurements. The second and third resonance frequencies are useful for separating signals in KPFM, resulting in better lateral resolution and potential difference measurements of the sample surface.

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“…More recently, another AFM-based potential detection technique was developed for electrostatic force imaging by analyzing the resonant frequencies. Specifically, electrostatic force microscopy operated in multifrequency mode, provides a promising technique for improving the spatial resolution and time resolution [43], and can be applied to obtain electrostatic and topographic images simultaneously [44,45].…”

Section: Kelvin Probe Force Microscopy (Kfm)mentioning

confidence: 99%

Surface Potential/Charge Sensing Techniques and Applications

Chen

Dong

Yang

2020

Sensors

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Surface potential and surface charge sensing techniques have attracted a wide range of research interest in recent decades. With the development and optimization of detection technologies, especially nanosensors, new mechanisms and techniques are emerging. This review discusses various surface potential sensing techniques, including Kelvin probe force microscopy and chemical field-effect transistor sensors for surface potential sensing, nanopore sensors for surface charge sensing, zeta potentiometer and optical detection technologies for zeta potential detection, for applications in material property, metal ion and molecule studies. The mechanisms and optimization methods for each method are discussed and summarized, with the aim of providing a comprehensive overview of different techniques and experimental guidance for applications in surface potential-based detection.

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Improving lateral resolution of electrostatic force microscopy by multifrequency method under ambient conditions

Abstract: Articles you may be interested in I-V characteristics of single and clustered ligand stabilized cobalt nanoparticles on highly oriented pyrolytic graphite obtained with conducting atomic force microscopy under ambient conditions

Cited by 24 publications

References 25 publications

Visualizing the Path of DNA through Proteins Using DREEM Imaging

Visualizing the Path of DNA through Proteins Using DREEM Imaging

Applying Second and Third Resonance Frequencies to Surface Potential Measurements with Kelvin Probe Force Microscopy

Surface Potential/Charge Sensing Techniques and Applications

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