2004
DOI: 10.1109/tcapt.2004.828557
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Improvements of Solder Ball Shear Strength of a Wafer-Level CSP Using a Novel Cu Stud Technology

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Cited by 13 publications
(6 citation statements)
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“…The averaged incremental equivalent plastic strain analysis was performed in determining the failure mode of the solder ball under the shear test, because the load on the pad site of the solder ball during a shear test is a mixture of tensile, shear and compressive forces, especially at the corners of the solder [18]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The averaged incremental equivalent plastic strain analysis was performed in determining the failure mode of the solder ball under the shear test, because the load on the pad site of the solder ball during a shear test is a mixture of tensile, shear and compressive forces, especially at the corners of the solder [18]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The equivalent plastic strain was used because the load on the Ni-P mini bump of the solder joint during a shear test is a mixture of tensile, shear, and compressive forces, especially at the corners of the solder. 14 From Fig. 3a, the high plastic strain region in the solder ball was near the contact point between the shear ram and the solder, and subsequently expanded through the solder in parallel to the chip surface.…”
Section: Resultsmentioning
confidence: 98%
“…In determining the failure mode of the solder ball under shear testing, analysis of the averaged incremental equivalent plastic strain was performed, because the load on the pad site of the solder ball during a shear test is a mixture of tensile, shear and compressive forces, especially at the corners of the solder (Chang and Chiang, 2004). Fig.…”
Section: Resultsmentioning
confidence: 99%