Improvements in the Quantitative Evaluation of Three-Dimensional Texture. I. The Nature of the Information Obtained from Pole Figures

Yu, Ligen; Guo, Huan; Hendrix, B. C.; Xu, Kewei; He, Jiangjiang

doi:10.1107/s0021889895001324

Cited by 1 publication

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“…The detector is set to the scattering angle for each of the chosen reflections and the sample is then tilted and rotated to create a map of the intensity and hence 'probability' function of the crystal orientations or pole figure. To create the orientation distribution of the crystallites requires involved mathematical methods of combining the results of the pole figures, Dahms and Bunge (1989); Järvinen (1993); Yu et al (1995). The general method of determining the orientation distribution function has been reviewed recently by Bunge (1992).…”

Section: Pole Figure and Orientation Distribution Methodsmentioning

confidence: 99%

X-ray analysis of thin films and multilayers

Fewster

1996

Rep. Prog. Phys.

135

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X-ray diffraction is sensitive to thin films of atomic dimensions to thicknesses of many tens of microns, by virtue of the x-ray wavelengths employed and the very high diffractionspace resolutions attainable. X-ray methods are generally non-destructive, in that sample preparation is not required, and they can provide a very appropriate route to obtain structural information on thin films and multilayers. Analysis can be performed across the whole spectrum of material types from perfect single crystals to amorphous materials. The choice of the x-ray diffraction analysis procedure depends on the quality of the structural form and therefore this review has been organized to reflect this. Following a description of the various material types, some typically important material parameters have been given arising from the application areas. These material parameters relating to the structure are then categorized into macroscopic and microscopic properties which can then be further subdivided and correlated to the most appropriate analysis method. It is clear from this that x-ray analysis covers the whole range and from this the recent developments will become clear. It is intended therefore that the reader is not compelled to read from beginning to end, but rather be able to find the structural parameter of interest to him/her in a simple way and from that discover the various approaches to its determination.

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