2013
DOI: 10.1117/12.2030380
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Improvements in the laser damage behavior of Ta2O5/SiO2interference coatings by modification of the top layer design

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Cited by 8 publications
(6 citation statements)
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“…However, reflection bandwidth, dispersion and damage threshold are interdependent, restricting each other [8]. Thereby, the LIDT of broad-bandwidth, low-dispersion mirrors have become a recognized research focus [8][9][10][11][12][13][14][15][16].…”
Section: Introductionmentioning
confidence: 99%
“…However, reflection bandwidth, dispersion and damage threshold are interdependent, restricting each other [8]. Thereby, the LIDT of broad-bandwidth, low-dispersion mirrors have become a recognized research focus [8][9][10][11][12][13][14][15][16].…”
Section: Introductionmentioning
confidence: 99%
“…This approach, also extended to a higher number of layers (also called reduced standing wave design), was proved to improve the LIDT in the short pulse regime [13,[23][24][25]. Ternary mirror designs were also proposed with the idea of using HfO2 only where high electric field intensities could not be avoided, and a higher index material (albeit less damage resistant) elsewhere to reduce the number of pairs necessary to attain the desired reflectivity [26]. Interestingly enough, authors studied the role of interface on stress [27].…”
Section: Introductionmentioning
confidence: 99%
“…We have already demonstrated increases in the laser damage threshold fluence of a Ta 2 O 5 /SiO 2 high reflection multilayer through replacement of Ta 2 O 5 with HfO 2 in the top three bilayers when tested using 0.35 ns pulses at λ = 1 μm [3]. We have also demonstrated the role of SiO 2 capping layers that reduce the electric field intensity in the structure to improve the laser induced damage resistance from laser pulses of 0.19 ns and 4 ns duration [4].…”
mentioning
confidence: 95%
“…The coatings were deposited by ion beam sputtering (IBS) using a metal target for the reactive sputtering of Ta 2 O 5 and a dielectric target for the deposition of SiO 2 . Further information on the deposition process has been presented elsewhere [3]. The interference coatings were deposited on one inch diameter, 0.25 inch thick fused silica substrates with an RMS roughness of 0.6 nm.…”
mentioning
confidence: 99%