2005
DOI: 10.1016/j.jcrysgro.2005.03.026
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Improvement of the structural and electrical properties of InAsSb epilayer using Sb-rich InAsSb buffer layer grown by hot wall epitaxy

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Cited by 6 publications
(4 citation statements)
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“…InAs 1−x Sb x epilayer thicknesses of 5.9 m and 4.3 m as listed in Table 1 far exceed the critical thickness values above mentioned, which means strain in the InAs 1−x Sb x heteroepitaxy film is almost completely relaxed. Vegard's law is a widely accepted way to obtain the composition of ternary alloy in the condition of the complete relaxation of strain [13][14][15]. Then the Sb contents of InAs 1−x Sb x epilayers are determined to be x1 = 0.08, x2 = 0.13 according to Vegard's law, which are also consistent with the EDAX results.…”
Section: Tablesupporting
confidence: 78%
“…InAs 1−x Sb x epilayer thicknesses of 5.9 m and 4.3 m as listed in Table 1 far exceed the critical thickness values above mentioned, which means strain in the InAs 1−x Sb x heteroepitaxy film is almost completely relaxed. Vegard's law is a widely accepted way to obtain the composition of ternary alloy in the condition of the complete relaxation of strain [13][14][15]. Then the Sb contents of InAs 1−x Sb x epilayers are determined to be x1 = 0.08, x2 = 0.13 according to Vegard's law, which are also consistent with the EDAX results.…”
Section: Tablesupporting
confidence: 78%
“…InAs 1−x Sb x has the smallest band gap among all conventional III-V alloys [1][2][3], which has attracted extensive interest for long-wavelength (8-12 m) optoelectronic applications. In recent years, ternary InAs 1−x Sb x has shown its potential usefulness for 8-12 m room-temperature devices [4][5][6].…”
Section: Introductionmentioning
confidence: 99%
“…So the strip pyramids are not the separate elemental antimony or indium phase. Nakamura [7,14] thought the strip pyramids imply a different incorporation behavior of the atoms to the growth surface compared with other compositional InAs x Sb 1−x (x ≤ 0.6). Surface morphology of the InAs 0.9 Sb 0.1 epilayers grown without buffer layers appears higher density of small paralleling strip pyramids (not shown here) which caused by compressive strains between epilayers and GaAs substrates.…”
Section: Resultsmentioning
confidence: 99%
“…So there exist compressive strains between epilayers and substrates which induce kinds of defects. The problem can be reduced by the incorporation of thin strained layers or by the growth of buffer layers with or without graded lattice parameters [6][7][8][9]. Supperlattice based on InAsSb are principally used as buffer layers.…”
Section: Introductionmentioning
confidence: 99%