2018
DOI: 10.1109/lpt.2018.2791631
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Improvement of Sidewall Roughness of Submicron SOI Waveguides by Hydrogen Plasma and Annealing

Abstract: We report the successful fabrication of low-loss submicrometric silicon-on-insulator strip waveguides for on-chip links. Postlithography treatment and postetching hydrogen annealing have been used to smoothen the waveguide sidewalls, as roughness is the major source of transmission losses. An extremely low silicon line-edge roughness of 0.75 nm is obtained with the optimized process flow. As a result, record-low optical losses of less than 0.5 dB/cm are measured at 1310 nm for strip waveguide dimensions exceed… Show more

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Cited by 34 publications
(17 citation statements)
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“…Recent studies have shown the pure hydrogen streams capability to smoothen out the sidewall roughness of single-mode silicon waveguides for TE-operation to record-low values, when operating such H 2 annealing at particular pressure, temperature, and time exposure conditions [30].…”
Section: Multistep Chemical-physical Annealing Of Si 3 N 4 Waveguidesmentioning
confidence: 99%
“…Recent studies have shown the pure hydrogen streams capability to smoothen out the sidewall roughness of single-mode silicon waveguides for TE-operation to record-low values, when operating such H 2 annealing at particular pressure, temperature, and time exposure conditions [30].…”
Section: Multistep Chemical-physical Annealing Of Si 3 N 4 Waveguidesmentioning
confidence: 99%
“…Another route is to smooth out the sidewalls using H2 thermal annealing. Previous studies have shown a strong reduction of Si waveguide roughness, down to sub-nanometer values [19]- [21]. Such a method showed a significant propagation loss improvement for standalone waveguides.…”
Section: Introductionmentioning
confidence: 89%
“…This reduces the edge roughness down to sub-nanometer values with no volume change. We used a post-etching H2 annealing process at 850°C [19]. Waveguide cross-sections with and without smoothing are shown in Fig.…”
Section: Silicon Waveguide Smoothing Processmentioning
confidence: 99%
“…In electronic circuits such as the wiring in silicon ICs, as the wiring width decreases, the transmission loss increases owing to the increase in electric resistance and stray capacitance. In silicon waveguides using propagating light waves in the 1310 and 1550 nm bands, the losses primarily induced by light scattering via side-wall roughness in the waveguide were a few tens of decibels per centimeter or less in the waveguides with sub-wavelength widths [23], [34]- [38]. In addition, the losses were over two orders of magnitude smaller than those of plasmonic waveguides in a similar sub-wavelength range.…”
Section: B Transmission Lossmentioning
confidence: 95%