2019
DOI: 10.1007/s10854-019-01930-9
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Improvement of polycrystalline InN thin films properties by localized ion source under low RF plasma ambient

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Cited by 4 publications
(2 citation statements)
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“…S1p, ESI†) analyses, minute amounts of carbon-based absorbates and interstitial nitrogen inclusions 44 were identified, along with possible components of InN. 45,46…”
Section: Resultsmentioning
confidence: 99%
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“…S1p, ESI†) analyses, minute amounts of carbon-based absorbates and interstitial nitrogen inclusions 44 were identified, along with possible components of InN. 45,46…”
Section: Resultsmentioning
confidence: 99%
“…S1p, ESI †) analyses, minute amounts of carbon-based absorbates and interstitial nitrogen inclusions 44 were identified, along with possible components of InN. 45,46 Laser-induced modification of nanowire optical properties Through a series of optical mirrors, the beam path of a 532 nm laser was directed through a back aperture of the metallurgical microscope unit. The laser travels a route identical to that of the optical light path, before it gets deflected by the dichroic mirror of the filter unit and is focused through the objective lens upon the sample surface.…”
Section: Production and Characterization: Indium Oxide (In 2 O 3 ) Na...mentioning
confidence: 99%