Improvement of Perpendicular Magnetic Properties by Postannealing for&amp;lt;tex&amp;gt;$hbox M^primehbox --CoCrPt--M$&amp;lt;/tex&amp;gt;Stacked Media (M,&amp;lt;tex&amp;gt;$hbox M^prime=hbox Ti$&amp;lt;/tex&amp;gt;, Ta, Ru, Pt, CrMn, MnSi)

Saito, Shin; Itagaki, N.; Takahashi, M.

doi:10.1109/tmag.2004.830160

Cited by 6 publications

(1 citation statement)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The CoCrPt film consisted of polycrystalline grains in which the grains and the grain boundaries commonly differ in their composition and magnetic properties [51,52]. Although such microstructures can be modeled as Voronoi tessellations [53][54][55] or as regular hexagonal arrays [56,57], in this case grains with square [58] cross sections were considered, and modeling was carried out using the NIST OOMMF code [41].…”

Section: Resultsmentioning

confidence: 99%

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

et al. 2014

View full text Add to dashboard Cite

Ferromagnetic domain patterns and three-dimensional domain-wall configurations in thin CoCrPt films with perpendicular magnetic anisotropy were studied in detail by combining magnetic force microscopy and polarized neutron reflectometry with micromagnetic simulations. With the first method, lateral dimension of domains with alternative magnetization directions normal to the surface and separated by domain walls in 20-nm-thick CoCrPt films were determined in good agreement with micromagnetic simulations. Quantitative analysis of data on reflectometry shows that domain walls consist of a Bloch wall in the center of the thin film, which is gradually transformed into a pair of Néel caps at the surfaces. The width and in-depth thickness of the Bloch wall element, transition region, and Néel caps are found consistent with micromagnetic calculations. A complex structure of domain walls serves to compromise a competition between exchange interactions, keeping spins parallel, magnetic anisotropy orienting magnetization normal to the surface, and demagnetizing fields, promoting in-plane magnetization. It is shown that the result of such competition strongly depends on the film thickness, and in the thinner CoCrPt film (10 nm thick), simple Bloch walls separate domains. Their lateral dimensions estimated from neutron scattering experiments agree with micromagnetic simulations.

show abstract

Section: Resultsmentioning

confidence: 99%

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

et al. 2014

View full text Add to dashboard Cite

show abstract

Combined effects of heat treatment and seed layer materials on magnetic properties of CoCrPt perpendicular media

Zhou

et al. 2008

Thin Solid Films

View full text Add to dashboard Cite

Magnetic Isolation for Hf–capped CoPtCr–SiO₂Perpendicular Media by Postannealing

Hinata¹,

Saito²,

Takahashi³

2011

J. Phys.: Conf. Ser.

View full text Add to dashboard Cite

Improvement of Perpendicular Magnetic Properties by Postannealing for<tex>$hbox M^primehbox --CoCrPt--M$</tex>Stacked Media (M,<tex>$hbox M^prime=hbox Ti$</tex>, Ta, Ru, Pt, CrMn, MnSi)

Cited by 6 publications

References 9 publications

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

Combined effects of heat treatment and seed layer materials on magnetic properties of CoCrPt perpendicular media

Magnetic Isolation for Hf–capped CoPtCr–SiO₂Perpendicular Media by Postannealing

Contact Info

Product

Resources

About

Improvement of Perpendicular Magnetic Properties by Postannealing for&lt;tex&gt;$hbox M^primehbox --CoCrPt--M$&lt;/tex&gt;Stacked Media (M,&lt;tex&gt;$hbox M^prime=hbox Ti$&lt;/tex&gt;, Ta, Ru, Pt, CrMn, MnSi)

Cited by 6 publications

References 9 publications

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

Combined effects of heat treatment and seed layer materials on magnetic properties of CoCrPt perpendicular media

Magnetic Isolation for Hf–capped CoPtCr–SiO2Perpendicular Media by Postannealing

Contact Info

Product

Resources

About

Improvement of Perpendicular Magnetic Properties by Postannealing for<tex>$hbox M^primehbox --CoCrPt--M$</tex>Stacked Media (M,<tex>$hbox M^prime=hbox Ti$</tex>, Ta, Ru, Pt, CrMn, MnSi)

Magnetic Isolation for Hf–capped CoPtCr–SiO₂Perpendicular Media by Postannealing