“…One of the critical issues for the application of organic fieldeffect transistors (OFETs) in flexible electronic systems is their electrical instability under repetitive mechanical deformation. For example, electrical instability, such as the degradation of the current on/ off ratio (I on /I off ), [1][2][3] increase in the leakage current, 1,4,7 shift of the threshold voltage, 1,4,5 and hysteresis, 4,5 has been observed during mechanical bending. The electrical degradation of the devices under mechanical bending is exacerbated by the cracking of the active and passive layers, as well as the delamination in between them.…”