2007
DOI: 10.1016/j.jcrysgro.2006.10.140
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Improvement of crystalline quality of N-polar AlN layers on c-plane sapphire by low-pressure flow-modulated MOCVD

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Cited by 53 publications
(55 citation statements)
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References 15 publications
(15 reference statements)
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“…(4) Physical vapor deposition techniques including sputtering Yoshino et al, 2000) and pulsed-laser deposition (Ryu et al, 2000), which is particularly amenable to complex chemistries . (5) Chemical vapor deposition (CVD) techniques, particularly metalorganic CVD (Kim and Lee, 2007;Takeuchi et al, 2007), that are well suited to singlecrystal fabrication.…”
Section: Streaming Assumptions Characteristics References Notesmentioning
confidence: 99%
“…(4) Physical vapor deposition techniques including sputtering Yoshino et al, 2000) and pulsed-laser deposition (Ryu et al, 2000), which is particularly amenable to complex chemistries . (5) Chemical vapor deposition (CVD) techniques, particularly metalorganic CVD (Kim and Lee, 2007;Takeuchi et al, 2007), that are well suited to singlecrystal fabrication.…”
Section: Streaming Assumptions Characteristics References Notesmentioning
confidence: 99%
“…8 However, the development of various growth methods has improved the epitaxial quality of AlN in recent years. These include alternating (e.g., MEE), [9][10][11][12][13][14][15] combination of simultaneous and alternating supply of precursors (e.g., modified MEE), 16 direct and hightemperature growth, [16][17][18] substrate pre-treatment (e.g., nitridation), 19,20 two-step LT-AlN BL and HT growth, 15,[21][22][23] multiple-step V/III growth, 18,24 precursor preflow, 25 and so on. However, despite the improvement in the surface morphology and structural quality of AlN, the existence of in-plane rotation domain as exhibited by SAGB is still observed regardless of growth method.…”
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confidence: 99%
“…26 While TMA preflow 25 and the LT-AlN BL with pre-nitridation 21 seem promising in-situ methods to eliminate the rotation domain, the influence of substrate's surface structure on its formation/elimination is not yet investigated in detail. The fragmentary understanding of the influence of surface structure is evident after the substrate is being subjected to thermal cleaning prior to AlN growth, 11,14,16,18,21,24 or the lack thereof. 10,13,15,22,25 Therefore, in this paper, we study the influence of the surface structure of sapphire substrate on the crystalline quality of AlN.…”
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confidence: 99%
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“…Consequently they exhibit rough surface morphology because the growth rate significantly depends on the polarity. Moreover, the polarity of the layers grown on c-plane sapphire is sensitive to the presurface treatment and the succeeding growth conditions [6]. Controlling both the defect and the polarity is a key issue in getting high-quality AlN layers on sapphire.…”
mentioning
confidence: 99%