2010
DOI: 10.1016/j.physb.2009.12.034
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Improvement in the optical absorption of PECVD microcrystalline Si thin film through modification of the crystalline fraction through an annealing process

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Cited by 4 publications
(2 citation statements)
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“…It has been reported that the absorption coefficient decreased as X c increases. 18 In this work, the absorption coefficient of Si:H films in regions I and II (amorphous region) slightly decreased as R increased from 4 to 19, and the highest absorption coefficient was obtained at [SiH 4 ] ¼ 22 sccm, at which point, the highest deposition rate was obtained. However, the change of absorption coefficient followed the trend of crystalline phase formation rather than that of deposition rate with respect to R, and the absorption coefficient in region III rapidly decreased with increasing R. That is because the absorption coefficient is mainly related to the crystalline state of the Si:H films.…”
Section: Resultsmentioning
confidence: 53%
“…It has been reported that the absorption coefficient decreased as X c increases. 18 In this work, the absorption coefficient of Si:H films in regions I and II (amorphous region) slightly decreased as R increased from 4 to 19, and the highest absorption coefficient was obtained at [SiH 4 ] ¼ 22 sccm, at which point, the highest deposition rate was obtained. However, the change of absorption coefficient followed the trend of crystalline phase formation rather than that of deposition rate with respect to R, and the absorption coefficient in region III rapidly decreased with increasing R. That is because the absorption coefficient is mainly related to the crystalline state of the Si:H films.…”
Section: Resultsmentioning
confidence: 53%
“…Compared with a-Si:H, lc-Si:H has a smaller band gap and can absorb photons of longer wavelength (near infrared range). 1,19 Therefore, the improved crystallinity of the intrinsic layer in the triple-GPL structure allows more photon absorption in a wider optical spectrum. Moreover, a better crystallinity of the intrinsic layer results in a smaller defect density at the interface between the p-layer and the intrinsic layer.…”
Section: Methodsmentioning
confidence: 99%