2019
DOI: 10.1016/j.orgel.2019.04.040
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Improvement in bias-stress and long-term stabilities for in-Ga-Zn-O thin-film transistors using solution-process-compatible polymeric gate insulator

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Cited by 9 publications
(4 citation statements)
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“…Here, mobility is measured as 22.72 (cm 2 V –1 s –1 ), which is a value comparable to those of top reports on the organic gate dielectric TFTs (Table ). In addition, the same configuration with a PPx-C dielectric layer also presents excellent device performances in both the linear and saturation regions (Figure S8). All of these results indicate that our PPx dielectrics not only are good candidates to replace SiO 2 layers but can also provide several advantages in terms of low-temperature processing, stable throughput, applicability to various type of semiconductora, and controllable thickness.…”
Section: Results and Discussionmentioning
confidence: 92%
“…Here, mobility is measured as 22.72 (cm 2 V –1 s –1 ), which is a value comparable to those of top reports on the organic gate dielectric TFTs (Table ). In addition, the same configuration with a PPx-C dielectric layer also presents excellent device performances in both the linear and saturation regions (Figure S8). All of these results indicate that our PPx dielectrics not only are good candidates to replace SiO 2 layers but can also provide several advantages in terms of low-temperature processing, stable throughput, applicability to various type of semiconductora, and controllable thickness.…”
Section: Results and Discussionmentioning
confidence: 92%
“…Coatings 2020, 10, x FOR PEER REVIEW 2 of 8 as substitutional defect and causes device instability [13][14][15], therefore, new treatment method to obtain the higher device performance of IGZO based TFTs still has been important issue. In this paper, we suggest the neutron irradiation treatment method to improve of the electrical characteristics on IGZO based TFTs.…”
Section: Methodsmentioning
confidence: 99%
“…To solve these problems, Park et al [11] and Ahn et al [12] demonstrated that the hydrogen ion irradiation method improved the electrical characteristics of IGZO based TFTs at room temperature due to the changes of the electronic structures such as the chemical bonding states, band gap, and the band edge states below the conduction band. Despite advantages such as low temperature and a short treatment time, the hydrogen ion irradiation method has critical problems in that hydrogen can diffuse in an oxide matrix as substitutional defect and causes device instability [13][14][15], therefore, new treatment method to obtain the higher device performance of IGZO based TFTs still has been important issue.…”
Section: Introductionmentioning
confidence: 99%
“…19 A further feature of solution-based devices is the use of polymers as preferred dielectric materials in contrast to the standard metal oxide insulators like HfO x or ZrO x . [20][21][22][23] Polymers are well soluble and can form a layer on the IGZO channel through a low-temperature deposition process without damaging the semiconductor. 22 Although solution-based processes show great promise, they face several critical problems, with IGZO film quality being the major concern.…”
Section: Introductionmentioning
confidence: 99%