2011
DOI: 10.1063/1.3581885
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Improved tunneling magnetoresistance at low temperature in manganite junctions grown by molecular beam epitaxy

Abstract: We report resistance versus magnetic field measurements for a La0.65Sr0.35MnO3/SrTiO3/La0.65Sr0.35MnO3 tunnel junction grown by molecular-beam epitaxy, that show a large field window of extremely high tunneling magnetoresistance (TMR) at low temperature. Scanning the in-plane applied field orientation through 360 • , the TMR shows 4-fold symmetry, i.e. biaxial anisotropy, aligned with the crystalline axes but not the junction geometrical long axis. The TMR reaches ∼ 1900 % at 4 K, corresponding to an interfaci… Show more

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Cited by 32 publications
(26 citation statements)
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“…The x-ray diffraction (XRD) measurements indicated the epitaxial growth of our films, without lattice relaxation. A spinreorientation characterized by the change of the easy axis from the original [1][2][3][4][5][6][7][8][9][10] to [001] was observed in the cooling process when the layer thickness of LCO exceeds 1 nm. This is different from the plain LSMO films which exhibit an easy axis along the [1-10] direction on (110)-LAO.…”
Section: Introductionmentioning
confidence: 99%
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“…The x-ray diffraction (XRD) measurements indicated the epitaxial growth of our films, without lattice relaxation. A spinreorientation characterized by the change of the easy axis from the original [1][2][3][4][5][6][7][8][9][10] to [001] was observed in the cooling process when the layer thickness of LCO exceeds 1 nm. This is different from the plain LSMO films which exhibit an easy axis along the [1-10] direction on (110)-LAO.…”
Section: Introductionmentioning
confidence: 99%
“…12,13 In these works, the adopted LSMO films were usually thick (30 nm to 500 nm) and usually focused on the (001)-orientation, for which the lattice strains are fourfold symmetric. However, the (110)-oriented manganite films deserve special attention, because the in-plane lattice strains along the [1][2][3][4][5][6][7][8][9][10] [001] directions are no longer equivalent. This will provide us an opportunity to tune in-plane MA via strain engineering.…”
Section: Introductionmentioning
confidence: 99%
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“…was investigated in Ref. [11]. LTSLM probes changes in the tunneling conductivity induced by local thermal perturbation, which allows to infer the spatial distribution of the relative magnetization orientation of the two electrodes.…”
mentioning
confidence: 99%
“…MTJs with area A J = 5×30 µm 2 were patterned by optical lithography; for details on sample characterization and fabrication see Ref. [11]. Figure 1 of the top and bottom electrode, respectively, is given by the angle Θ.…”
mentioning
confidence: 99%