The growing demand for renewable energy promotes the
rapid development
of power electronic technology. A safe insulation system is extremely
important for the reliable operation of power electronic devices.
Different from the conventional insulation system, the insulation
system of power electronic devices is subjected to high-frequency
voltage for a long period. The insulation failure of polymer dielectrics
under high-frequency voltage is increasingly prominent. However, seldom
is attention paid to investigate the high-frequency insulation of
polymer dielectrics. In this work, we incorporated a 5% equivalent
molar content of silica dioxide (SiO2), 1,3-bis(3-aminopropyl)-1,1,3,3-tetramethyldisiloxane
(GAPD), and PSS-octavinyl-substituted (POSS) into the polyimide (PI)
matrix and investigated the effects of these fillers on the high-frequency
insulation performance of PI films. We found that the high-frequency
breakdown strength of PI composites was significantly improved compared
with that of pristine PI film and the POSS/PI composites film displayed
the highest high-frequency breakdown strength. We analyzed the changes
of the dielectric, resistivity, and trap level properties and found
that the enhancement of high-frequency strength could be attributed
to the suppressed polarization loss and introduced deep traps. High
frequency voltage would cause the accumulation of heat inside the
film, and the suppressed dielectric loss could alleviate the heat
accumulation PI films and accordingly weaken the ablation degree of
film surface. Besides, the introduction of deep traps could mitigate
the distortion of local electric field. The synergetic effects of
above two factors contribute to the enhancement of high-frequency
insulation performance of PI composites. The findings of this work
are promising to provide a path for the design of high-frequency insulation
polymer dielectrics.