Implementation of BIST Technology using March-LR Algorithm

Rath, Manasa; Verma, Reshma; Koppad, Deepali

doi:10.1109/rteict46194.2019.9016784

Cited by 12 publications

(7 citation statements)

References 6 publications

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“…These tests provided conditions for detecting realistic LCFs within the considered models of linked faults and determining the technological and design features of the memory under testing [13,14]. Various modifications of the March LR and March LA tests are effectively used to detect dynamic unlinked faults [15], test dynamic memory (DRAM) [16], and implement memory built-in self-tests (BISTs) [17,18]. Specific march tests, such as March SS, March BLC-Opt, March SR, March MSS, and March m-MSS, are applied to cover bit-line coupling faults [19][20][21] and their diagnoses by applying March Cd [22].…”

Section: Necessary and Sufficient Conditions For Lcf Detectionmentioning

confidence: 99%

Linked Coupling Faults Detection by Multirun March Tests

Mrozek,

Yarmolik

2024

Applied Sciences

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This paper addresses the problem of describing the complex linked coupling faults of memory devices and formulating the necessary and sufficient conditions for their detection. The main contribution of the proposed approach is based on using a new formal model of such faults, the critical element of which is the introduction of roles and scenarios performed by the cells involved in the fault. Three roles are defined such that the cells of the complex linked coupling faults perform, namely, the roles of the aggressor (A), the victim (V), and both (B), performed by two cells simultaneously in relation to each other. The memory march test and applied address sequence and background determine the scenario for implementing the roles of memory faulty cells. The necessary and sufficient conditions for detecting linked coupling faults are given based on a new formal model. Formally, the undetectable linked coupling faults are defined, and the conditions for their detection are formulated using multirun memory march tests. The experimental investigation confirmed the validity of the proposed formulated statements. Based on the example of a linked coupling fault, this study demonstrates the fulfillment of the necessary and sufficient conditions for its detection using a single march test. As demonstrated in this article, employing the approach proposed by the authors, a two-pass march C test, for instance, enables the attainment of 55.42% fault coverage for linked coupling faults, inclusive of undetectable faults identified by the single-pass march test.

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Section: Necessary and Sufficient Conditions For Lcf Detectionmentioning

confidence: 99%

Linked Coupling Faults Detection by Multirun March Tests

Mrozek,

Yarmolik

2024

Applied Sciences

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“…March LR algorithm with 14 N test complexity was also proposed to detect several linked faults [53]. The authors in [14] claim the algorithms can detect all simple faults and coupling faults. However, by observing the test operation sequences in the algorithm and comparing them with the requirement described in Many researchers worked on improving the March test algorithms to detect new faults introduced by VDSM devices, such as DRDF, WDF, IRF, CFtr, CFdrd, CFwd, and CFir.…”

Section: Memory Testing Algorithmsmentioning

confidence: 99%

“…Memories in a chip can be tested using the memory BIST technique, which goal is to ensure the memories are free from any defect resulting in higher yields. Memory BIST technique also allows the reduction in overall testing cost since no external tester is needed and testing can be performed in parallel thus shortening test time [14]- [21].…”

Section: Introductionmentioning

confidence: 99%

A review paper on memory fault models and test algorithms

Jidin

Hussin

Fook³

et al. 2021

Bulletin EEI

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Testing embedded memories in a chip can be very challenging due to their high-density nature and manufactured using very deep submicron (VDSM) technologies. In this review paper, functional fault models which may exist in the memory are described, in terms of their definition and detection requirement. Several memory testing algorithms that are used in memory built-in self-test (BIST) are discussed, in terms of test operation sequences, fault detection ability, and also test complexity. From the studies, it shows that tests with 22 N of complexity such as March SS and March AB are needed to detect all static unlinked or simple faults within the memory cells. The N in the algorithm complexity refers to Nx*Ny*Nz whereby Nx represents the number of rows, Ny represents the number of columns and Nz represents the number of banks. This paper also looks into optimization and further improvement that can be achieved on existing March test algorithms to increase the fault coverage or to reduce the test complexity.

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“…Due to the linear complexity, regularity, symmetry and simplicity of the hardware implementations, the march tests are usually a preferred method, and often the only reasonable method, for RAM testing [ 14 , 15 , 16 , 17 , 18 , 19 ]. Therefore, to maximize the efficiency of transparent testing, a method based on the use of classic march tests was proposed by M. Nicolaidis [ 7 , 8 ].…”

Section: Transparent Testsmentioning

confidence: 99%

Transparent Memory Tests Based on the Double Address Sequences

Mrozek

Yarmolik

2021

Entropy

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An important achievement in the functional diagnostics of memory devices is the development and application of so-called transparent testing methods. This is especially important for modern computer systems, such as embedded systems, systems and networks on chips, on-board computer applications, network servers, and automated control systems that require periodic testing of their components. This article analyzes the effectiveness of existing transparent tests based on the use of the properties of data stored in the memory, such as changing data and their symmetry. As a new approach for constructing transparent tests, we propose to use modified address sequences with duplicate addresses to reduce the time complexity of tests and increase their diagnostic abilities.

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Implementation of BIST Technology using March-LR Algorithm

Cited by 12 publications

References 6 publications

Linked Coupling Faults Detection by Multirun March Tests

Linked Coupling Faults Detection by Multirun March Tests

A review paper on memory fault models and test algorithms

Transparent Memory Tests Based on the Double Address Sequences

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