Transparent Memory Tests Based on the Double Address Sequences

Mrozek, Ireneusz; Yarmolik, V. N.

doi:10.3390/e23070894

Cited by 3 publications

(1 citation statement)

References 25 publications

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“…In all cases, it was necessary to repeat the march test for various scenarios determined by the degrees of freedom inherent in march tests [20]. March memory tests detect complex faults by applying them repeatedly for various address sequences or initial memory cell states [31]. An essential result of multirun memory testing is detecting all possible faulty states.…”

Section: Multirun March Tests For Lcf Detectionmentioning

confidence: 99%

Linked Coupling Faults Detection by Multirun March Tests

Mrozek,

Yarmolik

2024

Applied Sciences

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This paper addresses the problem of describing the complex linked coupling faults of memory devices and formulating the necessary and sufficient conditions for their detection. The main contribution of the proposed approach is based on using a new formal model of such faults, the critical element of which is the introduction of roles and scenarios performed by the cells involved in the fault. Three roles are defined such that the cells of the complex linked coupling faults perform, namely, the roles of the aggressor (A), the victim (V), and both (B), performed by two cells simultaneously in relation to each other. The memory march test and applied address sequence and background determine the scenario for implementing the roles of memory faulty cells. The necessary and sufficient conditions for detecting linked coupling faults are given based on a new formal model. Formally, the undetectable linked coupling faults are defined, and the conditions for their detection are formulated using multirun memory march tests. The experimental investigation confirmed the validity of the proposed formulated statements. Based on the example of a linked coupling fault, this study demonstrates the fulfillment of the necessary and sufficient conditions for its detection using a single march test. As demonstrated in this article, employing the approach proposed by the authors, a two-pass march C test, for instance, enables the attainment of 55.42% fault coverage for linked coupling faults, inclusive of undetectable faults identified by the single-pass march test.

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Section: Multirun March Tests For Lcf Detectionmentioning

confidence: 99%

Linked Coupling Faults Detection by Multirun March Tests

Mrozek,

Yarmolik

2024

Applied Sciences

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Distance Measure for Controlled Random Tests

Yarmolik

Shauchenka

Petrovskaya

2022

Doklady Belorusskogo gosudarstvennogo universiteta informatiki

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The problem of constructing characteristics of the difference between test sequences is investigated. Its relevance for generating controlled random tests and the complexity of finding difference measures for symbolic tests are substantiated. The limitations of using the Hamming and Damerau–Levenshtein distances to obtain a measure of the difference between test patterns are shown. For an arbitrary case, a new measure of the difference between two symbolic test sets is determined based on the interval used in the theory of the chain of successive events. The distance D(Ti, Tk) between test patterns Ti and Tk, using the interval characteristic, is based on determining independent pairs of identical (equal) symbols belonging to two patterns and calculating the intervals between them. The combinatorial nature of the calculation, the proposed difference measure for symbolic test patterns of an arbitrary alphabet and dimension, is shown. An example of calculating this measure is given and its possible modifications and limitations are shown. The application of the measure of difference is considered for the case of multi-run testing of memory devices based on address sequences pA with even p repetition of addresses. For the case p = 2, mathematical relations are given for calculating intervals and distances D(Ti, Tk) for address sequences 2A used for controlled random testing of memory devices. Experimental results are presented confirming the effectiveness of the proposed difference measure.

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A measure of the difference between test sets for generating controlled random tests

Yarmolik

Petrovskaya

Mrozek

2023

Informatika (Minsk)

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Objectives . The problem of constructing the characteristics of the difference between test sequences is solved. Its relevance for generating controlled random tests and the complexity of finding measures of difference for symbolic tests are substantiated. The limitations of using the Hamming and Damerau – Levenshtein distances to obtain a measure of the difference between test sets are shown.Methods . Based on the characteristic of the interval used in the theory of the chain of successive events, a new measure of the difference between two symbolic test sets is determined. As a difference measure, the distance AD(Ti, Tk) between the test sets Ti and Tk is calculated using the interval characteristic, which is based on determining independent pairs of same (identical) symbols belonging to two sets and calculating the intervals between them.Results. The combinatorial nature of the calculation of the proposed difference measure for symbolic test sets of an arbitrary alphabet and dimension is shown. An example of calculating this measure for various types of test sets, including such as address test sets, is given. Possible modifications are shown and some properties and limitations are determined. The application of the measure of difference is considered for the case of repeated testing of storage devices based on address sequences pA with even p repetition of addresses. For the case p = 2, mathematical relations are given for calculating the intervals and distances AD(Ti, Tk) for address sequences 2A used for controlled random testing of storage devices. The main attention is paid to binary test sets, when the task of calculating given difference metric is reduced to the classical assignment problem using the Hungarian algorithm. The computational complexity of the Hungarian algorithm is estimated by the relation O(n4). As an alternative to the Hungarian algorithm, an algorithm for calculating the considered difference measure is proposed, the complexity of which is much less and has an estimate equal to O(n2). The experimental studies confirm the effectiveness of the proposed algorithm.Conclusion. The proposed difference measure extends the possibilities of generating test sequences when generating controlled random tests. It is shown that test sets, which are indistinguishable when Hamming distance is used as a measure of difference, have different values of AD(Ti, Tk) that allows to make more accurate classification of randomly generated sets as candidates for test sets.

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Transparent Memory Tests Based on the Double Address Sequences

Cited by 3 publications

References 25 publications

Linked Coupling Faults Detection by Multirun March Tests

Linked Coupling Faults Detection by Multirun March Tests

Distance Measure for Controlled Random Tests

A measure of the difference between test sets for generating controlled random tests

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