Abstract:A Design Of Experiments (DOE) methodology was suggested to define an optimized irradiation test plan. In this paper, the proposed test plan was used to model the degradation of the main performances (photo and dark current) of silicon based phototransistors arrays with respect to the Total Ionizing Dose (TID) and to the Displacement Damage Dose (DDD), over a wide range of space-kind environments. The expected performance degradation after an 18-year Low Earth Orbit (LEO) mission was calculated using this model… Show more
“…10 8 MeV/g. These last values have been used to compare the measured and the predicted results for both mean photo current and mean dark current [14].…”
Section: Predicted End-of-life Performance Of Silicon Based Phototranmentioning
“…10 8 MeV/g. These last values have been used to compare the measured and the predicted results for both mean photo current and mean dark current [14].…”
Section: Predicted End-of-life Performance Of Silicon Based Phototranmentioning
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