1996
DOI: 10.1016/0013-4686(95)00427-0
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Impedance spectroscopy at semiconductor electrodes: Review and recent developments

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Cited by 230 publications
(121 citation statements)
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“…For example, frequency dispersion in MS plots is often observed low frequencies. This has been attributed to non-idealities such as roughness of the samples, relaxation of the dielectric constant in the space charge region, and surface trapping states, [129] and explains the preferential use of high frequency to determine the sample capacitance. In addition, MS plots of hematite photoanodes have exhibited large deviations from linearity when V b @ V fb .…”
Section: Advanced Understanding By Using Electrochemical Impedance Spmentioning
confidence: 99%
“…For example, frequency dispersion in MS plots is often observed low frequencies. This has been attributed to non-idealities such as roughness of the samples, relaxation of the dielectric constant in the space charge region, and surface trapping states, [129] and explains the preferential use of high frequency to determine the sample capacitance. In addition, MS plots of hematite photoanodes have exhibited large deviations from linearity when V b @ V fb .…”
Section: Advanced Understanding By Using Electrochemical Impedance Spmentioning
confidence: 99%
“…5, proposed by Gomes and Vanmaekelbergh [18,19], to account for the impedance behaviour of crystalline SC/El interface in presence of electron charge transfer and/or recombination of electrons and holes trough surface states. Both processes could occur in the different potential regions where EIS spectra were obtained and by considering that the differential admittance measurements were performed in a very wide region of electrode potential, from the formation voltage, U F , close to the estimated V fb potential, so encompassing the HBB and LBB regime.…”
Section: Choice Of the Equivalent Circuit Of A-sc/el Interfacementioning
confidence: 99%
“…[5] This Mott-Schottky approach is also taken when a Schottky barrier is formed at the interface of the semiconductor film and electrolyte to monitor the carrier concentrations of the semiconductor electrodes. [8][9][10] C-V …”
mentioning
confidence: 99%
“…[8] The total value of the air capacitances of the device can be estimated using their configuration and dimensions in the device; their typical value is on the order of 10 -11 F. Moreover, the air resistance (R air ) is suggested to be much larger than the R sh of the p ++ -Si/n-ZnO nanorod junctions according to the I-V measurements. As shown in Figure 3a, fitting results with small fit- ting errors can be obtained using the equivalent circuit illustrated in Figure 3b when the values of CPE air and R air are set to ca.…”
mentioning
confidence: 99%