2020
DOI: 10.1364/prj.385249
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Impact of tin-oxide nanoparticles on improving the carrier transport in the Ag/p-GaN interface of InGaN/GaN micro-light-emitting diodes by originating inhomogeneous Schottky barrier height

Abstract: The effect of tin-oxide (SnO) nanoparticles, which are obtained by indium-tin-oxide (ITO) treatment, on the p-GaN surface of GaN-based flip-chip blue micro-light-emitting diode ( μ -LED) arrays is investigated. A thin Ag layer is deposited on the ITO-treated p-GaN surface by sputtering. SnO nanoparticles originate from inhomogeneous Schottky barrier heights (SBHs) at Ag/p-GaN contact. Therefore, effective SBH is reduced, which causes carrier transport into the μ … Show more

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Cited by 12 publications
(10 citation statements)
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“…After that, a Ni/Al/Ni (100/500/100 nm) capping layer was deposited on the Ag/p-GaN surface; a Cr/Al/Ni (30/500/100 nm) n-type electrode was deposited on the exposed n-GaN surface; and finally a Ni/Au/Ni/Au (100/600/100/800 nm) capping layer was deposited on the n-electrode, which served as a bonding pad. The detailed structure and fabrication processes used for the 32 × 32 pixelated flip-chip µ-LED arrays are reported elsewhere [29,30]. A fabricated µ-LED with its epitaxial structure is shown in Figure 1i.…”
Section: Device Structure and Measurement Setupmentioning
confidence: 99%
See 1 more Smart Citation
“…After that, a Ni/Al/Ni (100/500/100 nm) capping layer was deposited on the Ag/p-GaN surface; a Cr/Al/Ni (30/500/100 nm) n-type electrode was deposited on the exposed n-GaN surface; and finally a Ni/Au/Ni/Au (100/600/100/800 nm) capping layer was deposited on the n-electrode, which served as a bonding pad. The detailed structure and fabrication processes used for the 32 × 32 pixelated flip-chip µ-LED arrays are reported elsewhere [29,30]. A fabricated µ-LED with its epitaxial structure is shown in Figure 1i.…”
Section: Device Structure and Measurement Setupmentioning
confidence: 99%
“…The μ-LED arrays with a pixel area of 115 × 115 μm 2 were patterned using a photolithography process, then the mesa structure was etched by ICP in order to expose the n-GaN layer. The ITO treatment process was then performed on the p-GaN surface, which was described in our previous work [29]. A 250 nm-thick p-type Ag reflector was deposited on the ITO treated p-GaN surface.…”
Section: Device Structure and Measurement Setupmentioning
confidence: 99%
“…For vertically structured integrated devices, the growth of p-type and n-type GaN interacts with each other due to the difference in growth temperature, making epitaxial growth of vertically structured devices difficult. 26 In this paper, we propose a homogeneous monolithic integration of UVPT with a bipolar junction transistor (BJT) structure and μLED, where the UVPT has the same GaN material and process fabrication system as an LED. Compared with the photodetectors, MSM 27 and APD, 28 the UVPT with the BJT structure has some advantages of a lower operating bias voltage without avalanche noise, high responsiveness, large current gain and relatively simple fabrication process.…”
Section: Introductionmentioning
confidence: 99%
“…In horizontally structured integrated devices, the active region is small and the parasitic effect of metal leads is connected in a series of devices. For vertically structured integrated devices, the growth of p-type and n-type GaN interacts with each other due to the difference in growth temperature, making epitaxial growth of vertically structured devices difficult …”
Section: Introductionmentioning
confidence: 99%
“…It is unlikely that a single communication technology will be able to support these growing data demands. Therefore, future networks must support the coexistence and cooperation of different wireless technologies, including radio-frequency (RF), millimeter-wave, and light-wave technologies 10,11 .…”
Section: Introductionmentioning
confidence: 99%