Impact of surface roughness on tracer depth profiling and its implications for <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si7.gif" overflow="scroll"><mml:mmultiscripts><mml:mi mathvariant="normal">Cd</mml:mi><mml:mprescripts/><mml:none/><mml:mn>109</mml:mn></mml:mmultiscripts></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si8.gif" overflow="scroll"><mml:mmultiscripts><mml:mi mathvariant="normal">Zn</mml:mi><mml:mprescripts/><mml:none/><mml:mn>65</mml:

Two sets of diffusion-reaction numerical simulations using a finite difference method (FDM) were conducted to investigate fast impurity diffusion via interstitial sites in vacancy-rich materials such as Cu(In,Ga)Se2 (CIGS) and Cu2ZnSn(S, Se)4 (CZTSSe or CZTS) via the dissociative diffusion mechanism where the interstitial diffuser ultimately reacts with a vacancy to produce a substitutional. The first set of simulations extends the standard interstitial-limited dissociative diffusion theory to vacancy-rich material conditions where vacancies are annihilated in large amounts, introducing non-equilibrium vacancy concentration profiles. The second simulation set explores the vacancy-limited dissociative diffusion where impurity incorporation increases the equilibrium vacancy concentration. In addition to diffusion profiles of varying concentrations and shapes that were obtained in all simulations, some of the profiles can be fitted with the constant- and limited-source solutions of Fick’s second law despite the non-equilibrium condition induced by the interstitial-vacancy reaction. The first set of simulations reveals that the dissociative diffusion coefficient in vacancy-rich materials is inversely proportional to the initial vacancy concentration. In the second set of numerical simulations, impurity-induced changes in the vacancy concentration lead to distinctive diffusion profile shapes. The simulation results are also compared with published data of impurity diffusion in CIGS. According to the characteristic properties of diffusion profiles from the two set of simulations, experimental detection of the dissociative diffusion mechanism in vacancy-rich materials may be possible.

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Impact of surface roughness on tracer depth profiling and its implications for Cd109 and Zn65

Cited by 4 publications

References 12 publications

Measurement of surface roughness of plasma-deposited films using laser speckles

Measurement of surface roughness of plasma-deposited films using laser speckles

Chemical diffusion of copper in lead telluride

Dissociative diffusion mechanism in vacancy-rich materials according to mass action kinetics

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