2015
DOI: 10.1016/j.jallcom.2015.05.207
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Impact of pre-annealing temperature on the formation of Cu2ZnSnS4 absorber layer

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Cited by 11 publications
(2 citation statements)
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“…The Cu/Sn/Zn stack layers were then annealed in N 2 at 300 °C for 30 min to form an alloy. [ 22 ] To synthesize CZTS films, the alloy was annealed in H 2 S for sulfurization. In principle, quality of CZTS films will be determined by the initial Cu:Sn:Zn atomic ratios in the alloy and temperature and duration of annealing of alloy in H 2 S. In our investigation, atomic ratios of the metals in the alloy were controlled by changing the thicknesses of each metal stacked layer with the deposition durations.…”
Section: Methodsmentioning
confidence: 99%
“…The Cu/Sn/Zn stack layers were then annealed in N 2 at 300 °C for 30 min to form an alloy. [ 22 ] To synthesize CZTS films, the alloy was annealed in H 2 S for sulfurization. In principle, quality of CZTS films will be determined by the initial Cu:Sn:Zn atomic ratios in the alloy and temperature and duration of annealing of alloy in H 2 S. In our investigation, atomic ratios of the metals in the alloy were controlled by changing the thicknesses of each metal stacked layer with the deposition durations.…”
Section: Methodsmentioning
confidence: 99%
“…In the case of CTZC stack, Raman results show CZTS peaks near 255, 285, 322, 331 and 358 cm −1 [25][26][27][28]. For the films prepared with a low ramping rate Cu 2−x S [31] (467 cm −1 ) phase is observed while for the films prepared at a higher ramping rate, peaks of unreacted CTS (298 cm −1 ) [32] and ZnS (274 and 354 cm −1 ) [28,33] are also present thus suggesting that sulphurization time of 1 h is insufficient for the formation of CZTS at a higher ramping rate.…”
Section: 2a Xrdmentioning
confidence: 99%