Impact of NBTI on EMC behaviours of CMOS inverter

Fernández, R.; Berbel, Néstor; Gil, Ignacio; Morata, M.

doi:10.1109/apemc.2010.5475776

Cited by 6 publications

(2 citation statements)

References 5 publications

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“…Finally they could result in the changes of circuit characteristic which lead to the drift of susceptibility threshold. Researches show that HCI and NBTI are the major factors for the degraded performance of transistors, which lead to the changes of transistor parameters [12]. Just as the causation mentioned above, the change of circuit characteristic caused by different temperatures is likely lead, and it could induce the drift of susceptibility thresholds.…”

Section: B Microcontroller 1/0 Buffermentioning

confidence: 99%

Analysis of temperature effect on electromagnetic susceptibility of microcontroller

Liang¹,

Zhou²,

Zhao³

et al. 2015

2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)

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This paper presents a study about temperature effect on the conducted susceptibility level of a microcontroller. Based on direct power injection, the electromagnetic susceptibility of microcontroller is measured under different temperatures. Measurement results show that different temperature conditions could result in fluctuations of conducted susceptibility level. To analyze the temperature effect on susceptibility level, several potential threats in passive part, microcontroller input/output buffer and clock signal are presented in this paper.

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Section: B Microcontroller 1/0 Buffermentioning

confidence: 99%

Analysis of temperature effect on electromagnetic susceptibility of microcontroller

Liang¹,

Zhou²,

Zhao³

et al. 2015

2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)

View full text Add to dashboard Cite

show abstract

“…The relationships between negative bias, temperature instability, and hot carrier injection, caused by aging and the electromagnetic compatibility performance of the chip, were studied. Fernandez et al [27] concluded that the electromagnetic sensitivity of CMOS was affected by negative-bias temperature instability. The mechanism by which electromagnetic interference and thermal stress affect semiconductor devices was explained in their paper.…”

Section: The Effect Of Temperature On Emimentioning

confidence: 99%

Advances in Modeling and Suppression Methods of EMI in Power Electronic Converters of Third-Generation Semiconductor Devices

Gao

Wang

et al. 2023

Electronics

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With the development of high-frequency, miniaturized, and lightweight power electronic devices, third-generation semiconductor devices are more and more used in the main circuits of power electronic converters. The electromagnetic interference (EMI) generated by their fast switching can affect the performance of power electronic converters. Therefore, it is necessary to investigate the modeling and suppression methods of conducted noise in power electronic converters of third-generation semiconductor devices. This paper describes the EMI sources and coupling paths of EMI in third-generation semiconductor devices used in power electronic converters. The modeling methods of EMI are summarized from the perspectives of power devices and coupling paths. The suppression methods of conducted noise are summarized by suppressing EMI sources and improving coupling path characteristics. This paper provides a reference for the electromagnetic compatibility design of power electronic converters for third-generation semiconductor devices.

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Prediction of Long-term Immunity of a Phase-Locked Loop

Boyer

Dhia

et al. 2012

J Electron Test

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Degradation mechanisms accelerated by harsh conditions (high temperature, electrical stress) can affect circuit performances. Submitted to electromagnetic interferences, aged components can become more susceptible, which stirs up questions about the safety level of the final application. Unfortunately, the impact of circuit aging on its susceptibility level remains under evaluated and is not taken into account at circuit design level. This paper presents a first attempt of a modeling methodology aiming at predicting the impact of circuit aging on the susceptibility to electromagnetic interferences. This methodology is applied to model and explain the measured variations of the susceptibility level of phase-locked loop after an accelerated-life test.

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Impact of NBTI on EMC behaviours of CMOS inverter

Cited by 6 publications

References 5 publications

Analysis of temperature effect on electromagnetic susceptibility of microcontroller

Analysis of temperature effect on electromagnetic susceptibility of microcontroller

Advances in Modeling and Suppression Methods of EMI in Power Electronic Converters of Third-Generation Semiconductor Devices

Prediction of Long-term Immunity of a Phase-Locked Loop

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