2018 IEEE Electron Devices Kolkata Conference (EDKCON) 2018
DOI: 10.1109/edkcon.2018.8770425
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Impact of Device Parameters on the Threshold Voltage of Double-Gate, Tri-Gate and Gate-All-Around MOSFETs

Shankaranand Jha
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Santosh Kumar Choudhary
2
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Cited by 6 publications
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