A new form of imaging x-ray fluorescence spectrometer, based on a microchannel plate relay optic and a charge coupled device x-ray detector, produces elemental mapping over an instantaneous field of view of 24 mm square without the need to scan either the sample or x-ray beam. We describe the design of a prototype responsive over the energy range of 370 eV-10 keV, its quantitative calibration, demonstration of 0.7 mm spatial resolution and the spectrometer's use in the analysis of geological samples.