2011
DOI: 10.1063/1.3645022
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Imaging the formation of a p-n junction in a suspended carbon nanotube with scanning photocurrent microscopy

Abstract: We use scanning photocurrent microscopy (SPCM) to investigate individual suspended semiconducting carbon nanotube devices where the potential profile is engineered by means of local gates. In situ tunable p-n junctions can be generated at any position along the nanotube axis. Combining SPCM with transport measurements allows a detailed microscopic study of the evolution of the band profiles as a function of the gates voltage.Here we study the emergence of a p-n and a n-p junctions out of a n-type transistor ch… Show more

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Cited by 16 publications
(19 citation statements)
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“…This linearly increasing current can be described by replacing the p-type Schottky diode of the equivalent circuit of Figure 2a with a series resistor. 29 Our quantitative model of the nanoscale diode device shows how a variety of device characteristics can arise from apparently similar devices. The work function of the metal contacts, the band gap of the CNT, and the transmission coefficients all strongly affect the device characteristics.…”
Section: Resultsmentioning
confidence: 98%
See 1 more Smart Citation
“…This linearly increasing current can be described by replacing the p-type Schottky diode of the equivalent circuit of Figure 2a with a series resistor. 29 Our quantitative model of the nanoscale diode device shows how a variety of device characteristics can arise from apparently similar devices. The work function of the metal contacts, the band gap of the CNT, and the transmission coefficients all strongly affect the device characteristics.…”
Section: Resultsmentioning
confidence: 98%
“…Figure 1d shows the measured G(V g ) of a dual-gated suspended CNT. The CNT chiral index is (29,10) which corresponds to a diameter of 2.74 nm and an S 11 optical resonance energy of 430 meV (see Figure S2). To perform field-effect transistor measurements, the gates are configured such that V g1 = V g2 .…”
Section: Resultsmentioning
confidence: 99%
“…Details about the device fabrication has been reported elsewhere. 13,14 Two local gates at the bottom of the trench are used for electrostatic doping. A schematic representation of the device geometry can be found in the inset in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…The p-n junction was spatially located using scanning photocurrent microscopy, 13,15,16 where the excitation laser is raster scanned over the device and the photocurrent measured at every laser location. This generates the photocurrent image in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…Although the resolution of a classical optical microscope is restricted by diffraction to about half of the optical wavelength, scanning near-field optical microscopy (SNOM) has been proved to be a simple and direct measurement technique capable of highenergy accuracy (better than 3 meV) and lateral resolution to characterize semiconductor/metal interfaces [7][8][9][10][11][12][13][14][15][16]. For example, Coluzza [7] et al studied the Pt/n-GaP buried Schottky junction by this spatially resolved technique and correlated the chemical inhomogeneities of the interface with the spatial variations of the diode transport properties.…”
Section: Introductionmentioning
confidence: 99%