2014
DOI: 10.3390/app4010019
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Imaging of Volume Phase Gratings in a Photosensitive Polymer, Recorded in Transmission and Reflection Geometry

Abstract: Volume phase gratings, recorded in a photosensitive polymer by two-beam interference exposure, are studied by means of optical microscopy. Transmission gratings and reflection gratings, with periods in the order of 10 μm down to 130 nm, were investigated. Mapping of holograms by means of imaging in sectional view is introduced to study reflection-type gratings, evading the resolution limit of classical optical microscopy. In addition, this technique is applied to examine so-called parasitic gratings, arising f… Show more

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Cited by 8 publications
(14 citation statements)
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“…The volumetric shrinkage of this material system is 2% in average [7]. For more details on sample preparation, hologram recording and specific material characteristics, see [7,9,11,13].…”
Section: Hologram Generationmentioning
confidence: 99%
See 1 more Smart Citation
“…The volumetric shrinkage of this material system is 2% in average [7]. For more details on sample preparation, hologram recording and specific material characteristics, see [7,9,11,13].…”
Section: Hologram Generationmentioning
confidence: 99%
“…Research efforts are concentrated on material composition, processing and sample fabrication on the one hand [7][8][9][10], and on techniques and methods applied for recording and subsequent analysis on the other hand [7,9,[11][12][13][14][15][16]. In each case, there is a particular need to meet the high demands on precision and repetitive accuracy, accompanying volume holographic operations.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, metrology of a volume grating is challenging. Sabel and Zschocher avoided the limit of resolution and achieved the image of the volume phase gratings recorded in polymer using an optical microscopy [25]. Braun and co-workers had tried to monitor the eventual status of nanoparticle distribution in the holographic gratings using transmission electron microscopy Appl.…”
Section: Introductionmentioning
confidence: 99%
“…These theories are also useful to study the deviation from the sinusoidal profile provided by the higher orders. In many of the shrinkage models reported [9][10][11][12][13][14][15][16][17], it is supposed that the sinusoidal profile remains after the shrinkage occurs. If there is any deviation from this profile during the shrinkage, it is supposed to be a variation in the higher diffracted orders.…”
Section: Study Of the Diffracted Ordersmentioning
confidence: 99%