Imaging of microwave permittivity, tunability, and damage recovery in (Ba, Sr)TiO3 thin films

Steinhauer, D. E.; Vlahacos, C. P.; Wellstood, F. C.; Anlage, Steven M.; Canedy, C. L.; Ramesh, R.; Stanishevsky, Andrei; Melngailis, J.

doi:10.1063/1.125270

Cited by 85 publications

(74 citation statements)

References 12 publications

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“…Similarly, studies of microwave dissipation and relaxation in magnetic or dielectric materials have received great attention recently, e.g., to resolve the coupling of spins and charges in magnetic superconductors like the borocarbides or rutheno-cuprates [6,7,8], or materials displaying colossal magneto-resistance [9], or to search for low-loss ferrite or ferroelectric materials for frequency-agile devices [10,11,12]. …”

Section: Theoretical Backgroundmentioning

confidence: 99%

Recent developments in the characterization of superconducting films by microwaves

Hein

Getta

Kreiskott

et al. 2002

Physica C: Superconductivity

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We describe and analyze selected surface impedance data recently obtained by different groups on cuprate, ruthenate and diboride superconducting films on metallic and dielectric substrates for fundamental studies and microwave applications. The discussion includes a first review of microwave data on MgB 2 , the weak-link behaviour of RABiTS-type YBa 2 Cu 3 O 7-δ tapes, and the observation of a strong anomalous powerdependence of the microwave losses in MgO at low temperatures. We demonstrate how microwave measurements can be used to investigate electronic, magnetic, and dielectric dissipation and relaxation in the films and substrates. The impact of such studies reaches from the extraction of microscopic information to the engineering of materials and further on to applications in power systems and communication technology.Keywords: Surface impedance, superconducting films, microwave dissipation, relaxation.Address: Dr. Matthias Hein, Dept. of Physics, Univ. of Wuppertal, D-42097 Wuppertal, Germany. Tel. +49(202) 439-2747, Fax +49(202) Email: mhein@venus.physik.uni-wuppertal.de M. Hein et al., EUCAS 2001, invited paper B3-01, page 2 of 19 Microwave measurements in condensed matter physics Theoretical backgroundThis paper illustrates the relevance of microwave measurements for the investigation of electronic and magnetic transport and ordering in condensed matter. While most work has been done on solids, the described techniques could also be adapted to soft matter or liquids.The presentation is based on a selection of examples and does not attempt to provide a complete description of activities in this field.The complex-valued surface impedance Z s =R s +iX s at a microwave frequency ω=2πf is related to the permeability and conductivity of a material, µ and σ, in the local limit by ) (where R s and X s are the surface resistance and reactance [1]. The material parameters µ and σ are complex-valued and frequency dependent, e.g., via electronic, magnetic, or dielectric relaxation. The generalized conductivity σ characterizes electrical conduction through transport and displacement currents.The electrodynamic response of metallic materials provides information on the electronic properties within a surface layer of the order of the London penetration depth ~200 nm, and on a variable time scale ∼1/ω. Such information is complementary to thermodynamic bulk properties and low-frequency transport data. The high frequencies also help to derive Fermi surface properties, which would require strong magnetic fields at very low temperatures otherwise [2]. We will focus in the following on superconductors, for which Z s bears information on the density of states and quasiparticle excitations above and below the transition temperature T c [3]. It is also related to the phase purity, grain connectivity and interface effects of technical materials, which cannot readily be studied at similar resolution by At present at least 50 renowned academic and industrial groups study superconductors at microwave frequencies, to ...

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Section: Theoretical Backgroundmentioning

confidence: 99%

Recent developments in the characterization of superconducting films by microwaves

Hein

Getta

Kreiskott

et al. 2002

Physica C: Superconductivity

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“…17 Basic details of the microscope system used in the present work were described elsewhere. 18,19 Here we summarize the additional features of the broadband microscope.…”

Section: Methodsmentioning

confidence: 99%

Broadband dielectric microwave microscopy on micron length scales

Tselev

Anlage

et al. 2007

Review of Scientific Instruments

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We demonstrate that a near-field microwave microscope based on a transmission line resonator allows imaging in a substantially wide range of frequencies, so that the microscope properties approach those of a spatially-resolved impedance analyzer. In the case of an electric probe, the broadband imaging can be used in a direct fashion to separate contributions from capacitive and resistive properties of a sample at length scales on the order of one micron. Using a microwave near-field microscope based on a transmission line resonator we imaged the local dielectric properties of a Focused Ion Beam (FIB) milled structure on a high-dielectric-constant Ba 0.6 Sr 0.4 TiO 3 (BSTO) thin film in the frequency range from 1.3 GHz to 17.4 GHz. The electrostatic approximation breaks down already at frequencies above ~10 GHz for the probe geometry used, and a full-wave analysis is necessary to obtain qualitative information from the images.

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“…The first embodiment of this concept was conceived for measuring the moisture content of paper [40]. Other embodiments use coaxial transmission lines with the sample in contact with the open end [41,42,43,44,45,46,47,48,49,50,51,52,53,54,55,56], or with an air gap between the probe and the sample [43,44,45,46,47,48,49,50,51,52,53,54,55]. A related far-field technique has been used to image surface resistance and nonlinearity with a scanned dielectric resonator in contact with the sample [8].…”

Section: An Overview Of Microwave Microscopy Techniquesmentioning

confidence: 99%

“…To avoid the issue of topographic features corrupting the dielectric imaging, we have developed a contact-mode version of dielectric imaging [48]. We use the near-field scanning microwave microscope with a sharp protruding center conductor.…”

Section: Linear Dielectric Response -Contact Modementioning

confidence: 99%

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Near-Field Microwave Microscopy of Materials Properties

Anlage

Steinhauer

Feenstra

et al. 2001

Microwave Superconductivity

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Abstract. Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics, experiments can be carried out at high spatial resolution over a broad frequency range. In addition, the measurements can be done quantitatively so that images of microwave materials properties can be created. We review the five major types of nearfield microwave microscopes and discuss our own form of microscopy in detail. Quantitative images of microwave sheet resistance, dielectric constant, and dielectric tunability are presented and discussed. Future prospects for near-field measurements of microwave electrodynamic properties are also presented.

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Imaging of microwave permittivity, tunability, and damage recovery in (Ba, Sr)TiO3 thin films

Cited by 85 publications

References 12 publications

Recent developments in the characterization of superconducting films by microwaves

Recent developments in the characterization of superconducting films by microwaves

Broadband dielectric microwave microscopy on micron length scales

Near-Field Microwave Microscopy of Materials Properties

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