Near-Field Microwave Microscopy of Materials Properties

Anlage, Steven M.; Steinhauer, D. E.; Feenstra, B. J.; Vlahacos, C. P.; Wellstood, F. C.

doi:10.1007/978-94-010-0450-3_10

Cited by 39 publications

(21 citation statements)

References 73 publications

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“…The past decade has seen renewed effort in the microwave regime to develop a near-field scanning microwave microscope (NSMM) as a scientifically useful instrument [1,4]. An NSMM should in principle allow one to directly probe the local radiofrequency (RF) electrodynamic properties, e.g., the surface impedance (Z S ), the complex dielectric permittivity (ε), and permeability (μ) [5].…”

Section: Introductionmentioning

confidence: 99%

“…The voltage level in the signal line, which is termed here the common-mode signal, is inevitably high, resulting in large shot noise. Second, in several designs with a feedback mechanism [4], the reflected wave is used for both detection and tip-sample distance control, thus no independent signal exists for positioning. Finally, the sensing unit of many resonator-based NSMMs is bulky and the sharp STM-like tips are fragile [12][13][14].…”

Section: Introductionmentioning

confidence: 99%

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Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Lai

Leindecker

et al. 2007

Review of Scientific Instruments

107

109

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We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to significantly suppress the common-mode signal. Coplanar waveguides were patterned onto a silicon nitride cantilever interchangeable with atomic force microscope (AFM) tips, which are robust for high speed scanning. In the contact mode that we are currently using, the numerical analysis shows that contrast comes from both the variation in local dielectric properties and the sample topography. Our microscope demonstrates the ability to achieve high resolution microwave images on buried structures, as well as nano-particles, nano-wires, and biological samples.1

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Lai

Leindecker

et al. 2007

Review of Scientific Instruments

107

109

View full text Add to dashboard Cite

show abstract

“…For subwavelength characterization of microwave material parameters, special metallic probes are mostly used. The near fields of such metallic probes are well known evanescent-mode fields [48,49]. It becomes clear that new perfect lenses that can focus beyond the diffraction limit could revolutionize near-field microwave microscopy.…”

Section: Novel Microwave Near-field Sensors For Materials Characterizamentioning

confidence: 99%

Magnetic-Dipolar-Mode Oscillations for Near- And Far-Field Manipulation of Microwave Radiation

Kamenetskii

Joffe²,

Berezin³

et al. 2013

PIER B

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Abstract-There has been a surge of interest in the subwavelength confinement effects of the electromagnetic fields. Based on these effects, one can obtain new behaviors of the near-and far-field radiation.It is well known that in optics, the subwavelength confinement can be obtained due to surface-plasmon (or electrostatic) oscillations in metal structures. This paper is a review of recent studies on the subwavelength confinement in microwaves due to magnetic-dipolar-mode (MDM) [or magnetostatic (MS)] oscillations in small ferrite samples. MDM oscillations in a mesoscopic ferritedisk particle are quantized oscillations, which are characterized by energy eigenstates. The field structures are distinguished by powerflow vortices and non-zero helicity. Also in vacuum, the near fields originated from MDM particles are designated by topologically distinctive power-flow vortices, non-zero helicity, and a torsion degree of freedom.To differentiate such field structures from regular electromagnetic (EM) field structures, we term them as magnetoelectric (ME) fields. In a pattern of the microwave field scattered by a MDM ferrite disk and MDM-disk arrays, one can observe rotating topological-phase dislocations. This opens a perspective for creation of engineered electromagnetic fields with unique symmetry properties. In the near-field applications, we propose novel microwave sensors for material characterization, biology, and nanotechnology. Strong energy concentration and unique topological structures of the near fields originated from the MDM resonators allow effective measuring chiral properties of materials in microwaves. Generating

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“…С разработкой и развитием сканирую-щей микроволновой микроскопии (СММ) [1][2][3] возникло представление о возможности создания источников СВЧ поля со значитель-ной концентрации его энергии в локальной об-ласти трехмерного пространства [4]. Для них характерно практическое отсутствие излуче-ния в дальней зоне, в связи с чем такие ис-точники получили название ближнеполевых, эванесцентных.…”

Section: Introductionunclassified