2006
DOI: 10.1063/1.2354478
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Imaging nanostructures with scanning photoionization microscopy

Abstract: We report detailed studies of local electronic properties in nanostructured thin metallic films using scanning photoionization microscopy. This novel form of microscopy combines the advantages of diffraction-limited optical excitation with the ability to detect both photons and low kinetic energy photoelectrons, permitting sensitive characterization of heterogeneous surfaces under vacuum conditions. Using this technique, correlated measurements of multiphoton photoemission cross section and optical penetration… Show more

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Cited by 17 publications
(19 citation statements)
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“…15,112 PEEM, however, can be a complex tool requiring sophisticated electron optics and special care to avoid distortions due to charging. A diffraction-limited variant of the technique, scanning photoionization microscopy (SPIM), has been developed and used to study the behaviour of plasmonic particles such as rods and cubes; 80,[113][114][115] its high temporal resolution and relative simplicity are prominent advantages.…”
Section: Photoemissionmentioning
confidence: 99%
“…15,112 PEEM, however, can be a complex tool requiring sophisticated electron optics and special care to avoid distortions due to charging. A diffraction-limited variant of the technique, scanning photoionization microscopy (SPIM), has been developed and used to study the behaviour of plasmonic particles such as rods and cubes; 80,[113][114][115] its high temporal resolution and relative simplicity are prominent advantages.…”
Section: Photoemissionmentioning
confidence: 99%
“…82,83 Significant efforts have also gone into developing photoelectron spectroscopy with simultaneously high spatial and energy resolution, ranging from time-of-flight photoemission electron microscopy to spatially resolved photoionization microscopy. [84][85][86][87][88] Although some of these techniques are still in their infancy, new insights on the local environment and potentially the electrostatics may be anticipated. Certainly, the growth of highly uniform heteroepitaxial thin films, although likely unrealistic for real devices, provides a helpful first step in limiting the influence of electrostatic site-dispersion as well.…”
Section: Electrostatics and Interfacial Charge Transfer: Implications...mentioning
confidence: 99%
“…The setup is very similar to the velocity map imaging (VMI) method, which was conventionally used in gas-phase measurements of photoionization and photodissociation dynamics . We note that there have been great efforts in transferring the conventional VMI method from gas phase to surface studies. However, the 3D capability has been lacking until this work.…”
mentioning
confidence: 99%