Imaging and recording of multiple scattering effects by angular-resolved Electron Energy-Loss Spectroscopy

Reimer, Ludwig; Rennekamp, R.

doi:10.1016/0304-3991(89)90305-7

Cited by 24 publications

(11 citation statements)

References 7 publications

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“…For a quantitative chemical analysis, however, HREM may only be applied in special cases where a significant change of either the image pattern [1 to 3] or of the unit cell dimension [4 to 6] can be unambiguously related to compositional changes. We may distinguish three methods of acquiring energy-loss data, namely EELS applied in the scanning mode (the standard method [10,11]), electron spectroscopic imaging (ESI) with several images at different energy losses [12], spec-trum imaging with a spatial coordinate perpendicular to the energy-dispersive direction [13]. An alternative to EDX is electron energy-loss spectroscopy (EELS) which offers better spatial resolution as long tail components of the effective probe are eliminated by using a collection aperture and it often yields better statistics [9].…”

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confidence: 88%

A Study of Sulphur Diffusion in ZnMgSSe/ZnSe Quantum Wells by Energy-Loss Imaging in a Transmission Electron Microscope

Walther

Kalisch

Heime

et al. 2000

phys. stat. sol. (a)

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The technique of spectrum imaging in a transmission electron microscope with energy filter and two-dimensional detector is applied to a ZnMgSSe/ZnSe multiple quantum well laser structure. Quantitative S profiles are extracted from this quaternary system with an accuracy better than 1 at% at a spatial resolution of 1 nm. From a comparison of as-grown and annealed structures the diffusivity is calculated to 6 Â 10 ± ±22 m 2 s ± ±1 at a temperature of 277 C.

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confidence: 88%

A Study of Sulphur Diffusion in ZnMgSSe/ZnSe Quantum Wells by Energy-Loss Imaging in a Transmission Electron Microscope

Walther

Kalisch

Heime

et al. 2000

phys. stat. sol. (a)

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“…A rectangular slit can be placed at the entrance of the filter in order to select a direction in reciprocal space [29,30]. The orientation of the slit is fixed, and its larger dimension is perpendicular to the direction of the energy dispersion.…”

Section: Tem-eels Experimentsmentioning

confidence: 99%

Angle-resolved electron energy loss spectroscopy in hexagonal boron nitride

et al. 2017

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Electron energy loss spectra were measured on hexagonal boron nitride single crystals employing an electron energy loss spectroscopic setup composed of an electron microscope equipped with a monochromator and an in-column filter. This setup provides high-quality energy-loss spectra and allows also for the imaging of energy-filtered diffraction patterns. These two acquisition modes provide complementary pieces of information, offering a global view of excitations in reciprocal space. As an example of the capabilities of the method we show how easily the core loss spectra at the K edges of boron and nitrogen can be measured and imaged. Low losses associated with interband and/or plasmon excitations are also measured. This energy range allows us to illustrate that our method provides results whose quality is comparable to that obtained from nonresonant x-ray inelastic scattering but with advantageous specificities such as an enhanced sensitivity at low q and a much greater simplicity and versatility that make it well adapted to the study of two-dimensional materials and related heterostructures. Finally, by comparing theoretical calculations to our measures, we are able to relate the range of applicability of ab initio calculations to the anisotropy of the sample and assess the level of approximation required for a proper simulation of our acquisition method.

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“…These differences in the ESI, ESD and EELS modes are summarized in Table 1 (see also Table 2 in Reimer et al, 1988). Other possible modes are the angle-and spacedispersive EELS modes, where a slit a few micrometres in width is introduced in the filter-entrance plane and either the ESD or the ESI image of the slit, as appropriate, is defocused by the last projector lens, producing an energy-loss dispersion normal to the slit image (Batson & Silcox, 1983;Reimer & Rennekamp, 1989).…”

Section: Esi Esd and Electron Energy-loss Spectroscopy (Eels) Modesmentioning

confidence: 99%

Investigation and use of plasmon losses in energy‐filtering transmission electron microscopy

Fromm

Reimer

Rennekamp

1992

Journal of Microscopy

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SUMMARY The electron spectroscopic imaging (ESI), diffraction (ESD) and different types of electron energy‐loss spectroscopy (EELS) modes in an energy‐filtering transmission electron microscope can all be used for the investigation and analytical use of plasmon losses. Shifts of plasmon losses caused by differences in composition can be detected with an accuracy of 0.1 eV by parallel‐recorded EELS (PEELS). The dispersion of plasmon losses and the cut‐off angle θc can be observed by angle‐dispersive EELS and by recording spectra at different scattering angles θ. ESD patterns with a selected energy window width of 1 eV enable the dispersion and its anisotropy to be imaged by characteristic intensity distributions between the primary beam and the first Bragg diffracted beams. The ESI mode can be used for the selective imaging of precipitates and for the investigation of the excitation volume of plasmons in small particles.

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Imaging and recording of multiple scattering effects by angular-resolved Electron Energy-Loss Spectroscopy

Cited by 24 publications

References 7 publications

A Study of Sulphur Diffusion in ZnMgSSe/ZnSe Quantum Wells by Energy-Loss Imaging in a Transmission Electron Microscope

A Study of Sulphur Diffusion in ZnMgSSe/ZnSe Quantum Wells by Energy-Loss Imaging in a Transmission Electron Microscope

Angle-resolved electron energy loss spectroscopy in hexagonal boron nitride

Investigation and use of plasmon losses in energy‐filtering transmission electron microscopy

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