2015
DOI: 10.1109/tase.2014.2327029
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Image-Based Process Monitoring Using Low-Rank Tensor Decomposition

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Cited by 112 publications
(47 citation statements)
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“…The use of image data for part quality inspection is becoming more widespread in industry (Qiu, 2005;Yan et al, 2015;Megahed et al, 2011). Random porous and cellular materials represent a category of complicated structures where novel SPC methods are needed to cope with the challenging nature of quality inspection data (Kim et al, 2014;Zhuravleva et al, 2013;Campoli et al, 2013;Banhart, 2001).…”
Section: A Motivating Real Case Studymentioning
confidence: 99%
“…The use of image data for part quality inspection is becoming more widespread in industry (Qiu, 2005;Yan et al, 2015;Megahed et al, 2011). Random porous and cellular materials represent a category of complicated structures where novel SPC methods are needed to cope with the challenging nature of quality inspection data (Kim et al, 2014;Zhuravleva et al, 2013;Campoli et al, 2013;Banhart, 2001).…”
Section: A Motivating Real Case Studymentioning
confidence: 99%
“…While tensor voting in images has been extensively studied [7], [45], there is little work on tensor voting of 3-D surfaces. This is despite the fact that the 3-D surfaces become ever more widespread and have myriad applications.…”
Section: G Tensor Votingmentioning
confidence: 99%
“…Morphology of nanoparticles was characterized by a multistage procedure and then semiautomatically classify them into homogeneous groups. Yan et al proposed to integrate low‐rank tensor decomposition with multivariate control charts for image‐based process monitoring . In addition, Zhang et al measured the variations of wafer thickness from image profiles using an adaptive Gaussian process model.…”
Section: Research Backgroundmentioning
confidence: 99%
“…Yan et al proposed to integrate low-rank tensor decomposition with multivariate control charts for imagebased process monitoring. 23 In addition, Zhang et al 3 measured the variations of wafer thickness from image profiles using an adaptive Gaussian process model.…”
Section: Image Profilesmentioning
confidence: 99%